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Impurity Precipitation, Dissolution, Gettering and Passivation in Pv Silicon: Final Technical Report

Impurity Precipitation, Dissolution, Gettering and Passivation in Pv Silicon: Final Technical Report

          
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About the Book

This report describes the major progress in understanding the physics of transition metals in silicon and their possible impact on the efficiency of solar cells that was achieved during the three-year span of this subcontract. We found that metal-silicide precipitates and dissolved 3d transition metals can be relatively easily gettered. Gettering and passivating treatments must take into account the individuality of each transition metal. Our studies demonstrated how significant is the difference between defect reactions of copper and iron. Copper does not significantly affect the minority-carrier diffusion length in p-type silicon, at least as long as its concentration is low, but readily precipitates in n-type silicon. Therefore, copper precipitates may form in the area of p-n junctions and cause shunts in solar cells. Fortunately, copper precipitates are present mostly in the chemical state of copper-silicide and can relatively easily be dissolved. In contrast, iron was found to form clusters of iron-oxides and iron-silicates in the wafers. These clusters are thermodynamically stable even in high temperatures and are extremely difficult to remove. The formation of iron-silicates was observed at temperatures over 900?C.


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Product Details
  • ISBN-13: 9781249134336
  • Publisher: Bibliogov
  • Publisher Imprint: Bibliogov
  • Height: 246 mm
  • No of Pages: 92
  • Series Title: English
  • Sub Title: Final Technical Report
  • Width: 189 mm
  • ISBN-10: 1249134331
  • Publisher Date: 20 Jul 2012
  • Binding: Paperback
  • Language: English
  • Returnable: N
  • Spine Width: 5 mm
  • Weight: 181 gr


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