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1.
Scattering & Surface RoughnessNR
Publisher: Spie Press
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₹10,558
Binding:
Paperback
Release:
15 Jun 2006
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2.
Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies IINR
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3.
Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies IIINR
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4.
Scattering and Surface Roughness III (SPIE Conference Proceedings)NR
Publisher: Spie Press
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₹10,724
Binding:
Paperback
Release:
30 Nov 2000
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