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Zhiyong Ma

Zhiyong Ma

3 results found
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1.
Metrology and Diagnostic Techniques for Nanoelectronics33 % NR
Metrology and Diagnostic Techniques for Nanoelectronics
By: David G. Seiler, Zhiyong Ma, David G Seiler, David G. (National Institute of Standards and Technology, Hillsboro, OR, USA) Seiler, Zhiyong (Intel Corporation, Hillsboro, OR, USA) Ma
Publisher: Pan Stanford Publishing
No Review Yet
₹39,095
₹26,194
Binding:
Hardback
Release:
03 Oct 2016
Language:
English
Available
Ships within 2-4 Days Explain..
2.
Global Well-Posedness and Asymptotic Behavior of the Solutions to Non-Classical Thermo(visco)Elastic Models37 %
Global Well-Posedness and Asymptotic Behavior of the Solutions to Non-Classical Thermo(visco)Elastic Models
By: Yuming Qin, Zhiyong Ma
Publisher: Springer
No Review Yet
₹12,480
₹7,862
Binding:
Paperback
Release:
12 Jun 2018
Language:
English
Available
Ships within 12-14 Days Explain..
3.
Global Well-Posedness and Asymptotic Behavior of the Solutions to Non-Classical Thermo(visco)Elastic Models37 %
Global Well-Posedness and Asymptotic Behavior of the Solutions to Non-Classical Thermo(visco)Elastic Models
By: Yuming Qin, Zhiyong Ma
Publisher: Springer
No Review Yet
₹12,480
₹7,862
Binding:
Hardback
Release:
18 Oct 2016
Language:
English
Available
Ships within 12-14 Days Explain..
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