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Zhiyong (Intel Corporation, Hillsboro, OR, USA) Ma

Zhiyong (Intel Corporation, Hillsboro, OR, USA) Ma

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Metrology and Diagnostic Techniques for Nanoelectronics49 % NR
Metrology and Diagnostic Techniques for Nanoelectronics
By: David G. Seiler, Zhiyong Ma, David G Seiler, David G. (National Institute of Standards and Technology, Hillsboro, OR, USA) Seiler, Zhiyong (Intel Corporation, Hillsboro, OR, USA) Ma
Publisher: Pan Stanford Publishing
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₹43,680
₹22,277
Binding:
Hardback
Release:
03 Oct 2016
Language:
English
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