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Yervant Zorian

Yervant Zorian

13 results found
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1.
Multi-Chip Module Test Strategies37 %
Multi-Chip Module Test Strategies
By: Yervant Zorian
Publisher: Kluwer Academic Publishers
No Review Yet
₹10,949
₹6,898
Binding:
Hardback
Release:
31 May 1997
Language:
English
Available
Ships within 22-24 Days Explain..
2.
Multi-Chip Module Test Strategies37 %
Multi-Chip Module Test Strategies
By: Yervant Zorian
Publisher: Springer-Verlag New York Inc.
No Review Yet
₹10,949
₹6,898
Binding:
Paperback
Release:
04 Oct 2012
Language:
English
Available
Ships within 12-14 Days Explain..
3.
On-Line Testing for VLSI37 %
On-Line Testing for VLSI
By: Michael Nicolaidis, Dhiraj Pradhan, Yervant Zorian
Publisher: Kluwer Academic Publishers
No Review Yet
₹10,949
₹6,898
Binding:
Hardback
Release:
30 Apr 1998
Language:
English
Available
Ships within 22-24 Days Explain..
4.
On-Line Testing for VLSI37 %
On-Line Testing for VLSI
By: Michael Nicolaidis, Dhiraj Pradhan, Yervant Zorian
Publisher: Springer-Verlag New York Inc.
No Review Yet
₹10,949
₹6,898
Binding:
Paperback
Release:
06 Dec 2010
Language:
English
Available
Ships within 12-14 Days Explain..
5.
Embedded Processor-Based Self-Test37 %
Embedded Processor-Based Self-Test
By: A. Paschalis, Dimitris Gizopoulos, Yervant Zorian
Publisher: Springer-Verlag New York Inc.
No Review Yet
₹16,424
₹10,347
Binding:
Paperback
Release:
14 Dec 2011
Language:
English
Available
Ships within 12-14 Days Explain..
6.
Collaboration and Technology36 %
Collaboration and Technology
By: Nelson Baloian, Perouz Taslakian, Yervant Zorian, Samvel Shoukouryan
Publisher: Springer International Publishing AG
No Review Yet
₹5,256
₹3,364
Binding:
Paperback
Release:
27 Aug 2015
Language:
English
Available
Ships within 12-14 Days Explain..
7.
Principles of Testing Electronic Systems14 % POD/NR
Principles of Testing Electronic Systems
By: Samiha Mourad, Yervant Zorian
Publisher: John Wiley & Sons Inc
No Review Yet
₹17,583
₹15,121
Binding:
Hardback
Release:
15 Aug 2000
Language:
English
International Edition
Ships within 12-14 Days Explain..
Free Shipping in India and low cost Worldwide.
Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
8.
Embedded Processor-Based Self-TestPOD/NR
Embedded Processor-Based Self-Test
By: A. Paschalis, Dimitris Gizopoulos, Yervant Zorian
Publisher: Springer-Verlag New York Inc.
No Review Yet
₹16,171
Binding:
Hardback
Release:
20 Dec 2004
Language:
English
International Edition
Ships within 16-18 Days Explain..
Free Shipping in India and low cost Worldwide.
Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
9.
Multi-Chip Module Test Strategies
Multi-Chip Module Test Strategies
By: Yervant Zorian
Publisher: Springer My Copy UK
No Review Yet
₹2,201
Binding:
Paperback
Release:
01 May 1997
Out of Stock
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10.
2002 Memory Technology Design Testing Int
2002 Memory Technology Design Testing Int
By: Yervant Zorian, B Courtois, T Wik
Publisher: IEEE Computer Society Press,U.S.
No Review Yet
₹13,209
Binding:
Hardback
Release:
01 Jan 2002
Language:
English
Out of Stock
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11.
Embedded Processor-Based Self-Test
Embedded Processor-Based Self-Test
By: Dimitris Gizopoulos, Yervant Zorian, Antonis Paschalis
Publisher: Springer London
No Review Yet
₹11,056
Binding:
Digital (delivered electronically)
Release:
01 Dec 2005
Language:
English
Out of Stock
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12.
Embedded Processor-Based Self-Test
Embedded Processor-Based Self-Test
By: Dimitris Gizopoulos, Yervant Zorian, A Paschalis
Publisher: Springer My Copy UK
No Review Yet
₹2,201
Binding:
Paperback
Release:
20 Dec 2004
Out of Stock
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13.
On-Line Testing for VLSI
On-Line Testing for VLSI
By: Michael Nicolaidis, Yervant Zorian, Dhiraj Pradhan (Stanford Univ. Stanford University Stanford University Stanford University Stanford University Stanford University Stanford University Stanford University Stanford University Stanford University Stanford University Stanford University Stan
Publisher: Springer
No Review Yet
₹2,201
Binding:
Paperback
Release:
15 Jan 2014
Out of Stock
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