· FLAT 10% Off (Maximum Discount Rs.50) Use Code - BWSPECIAL10

· Grab Bestselling Books upto 50% Off!

· FLAT 10% Off (Maximum Discount Rs.50) Use Code - BWSPECIAL10

· Grab Bestselling Books upto 50% Off!

· FLAT 10% Off (Maximum Discount Rs.50) Use Code - BWSPECIAL10

· Grab Bestselling Books upto 50% Off!

Humburger Icon
Logo1
Login & Sign up
Bookswagon-24x7 online bookstore
AddBanner
Home icon Home
Account Icon Account
Wishlist Icon Wishlist
Cart Icon Cart
Bookswagon icon Categories
Close

Refine your Search

By Price

Availability

Shipping Time

Source

Binding

Language

Publication Year

Filter By Category
Yale Strausser

Yale Strausser

3 results found
List viewGrid view
Sort By:
1.
Characterization In Compound Semiconductor Processing
Characterization In Compound Semiconductor Processing
By: C. Richard Brundle, Yale (EDT) Strausser, Gary E. (EDT) McGuire, Gary E. McGuire, Yale E. Strausser
Publisher: Momentum Press
No Review Yet
₹3,292
Binding:
Hardback
Release:
01 Feb 2010
Language:
English
Available
Ships within 4-6 Days Explain..
2.
Characterization in Silicon Processing
Characterization in Silicon Processing
By: C. Richard Brundle, Charles A., Jr. Evans, Yale E. (EDT) Strausser, Yale E. Strausser, Yale Strausser
Publisher: Momentum Press
No Review Yet
₹3,292
Binding:
Hardback
Release:
01 Feb 2010
Language:
English
Available
Ships within 4-6 Days Explain..
3.
Characterization of Organic Thin Films
Characterization of Organic Thin Films
By: Abraham Ullman, C. Richard Brundle, Yale (EDT) Strausser, Gary E. (EDT) McGuire, Abraham Ulman
Publisher: Momentum Press
No Review Yet
₹3,182
Binding:
Hardback
Release:
01 Feb 2010
Language:
English
Available
Ships within 4-6 Days Explain..
No more records found