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Yale (EDT) Strausser

Yale (EDT) Strausser

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1.
Characterization In Compound Semiconductor Processing
Characterization In Compound Semiconductor Processing
By: C. Richard Brundle, Yale (EDT) Strausser, Gary E. (EDT) McGuire, Gary E. McGuire, Yale E. Strausser
Publisher: Momentum Press
No Review Yet
₹3,292
Binding:
Hardback
Release:
01 Feb 2010
Language:
English
Available
Ships within 4-6 Days Explain..
2.
Characterization in Silicon Processing
Characterization in Silicon Processing
By: C. Richard Brundle, Charles A., Jr. Evans, Yale E. (EDT) Strausser, Yale E. Strausser, Yale Strausser
Publisher: Momentum Press
No Review Yet
₹3,292
Binding:
Hardback
Release:
01 Feb 2010
Language:
English
Available
Ships within 4-6 Days Explain..
3.
Characterization of Organic Thin Films
Characterization of Organic Thin Films
By: Abraham Ullman, C. Richard Brundle, Yale (EDT) Strausser, Gary E. (EDT) McGuire, Abraham Ulman
Publisher: Momentum Press
No Review Yet
₹3,182
Binding:
Hardback
Release:
01 Feb 2010
Language:
English
Available
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