· FLAT 10% Off (Maximum Discount Rs.50) Use Code - BWSPECIAL10

· Grab Bestselling Books upto 50% Off!

· FLAT 10% Off (Maximum Discount Rs.50) Use Code - BWSPECIAL10

· Grab Bestselling Books upto 50% Off!

· FLAT 10% Off (Maximum Discount Rs.50) Use Code - BWSPECIAL10

· Grab Bestselling Books upto 50% Off!

Humburger Icon
Logo1
Login & Sign up
Bookswagon-24x7 online bookstore
AddBanner
Home icon Home
Account Icon Account
Wishlist Icon Wishlist
Cart Icon Cart
Bookswagon icon Categories
Close

Refine your Search

By Price

Availability

Shipping Time

Source

Binding

Language

Publication Year

Filter By Category
William F. Filter

William F. Filter

5 results found
List viewGrid view
Sort By:
1.
Materials Reliability in Microelectronics III: Volume 30937 %
Materials Reliability in Microelectronics III: Volume 309
By: William F. Filter, Paul S. (University of Texas, Austin) Ho, Harold J. (Dartmouth College, New Hampshire) Frost, Harold J Frost, Kenneth P Rodbell
Publisher: Cambridge University Press
No Review Yet
₹2,806
₹1,768
Binding:
Hardback
Release:
31 Aug 1993
Language:
English
Available
Ships within 1-2 Days Explain..
2.
Materials Reliability in Microelectronics III: Volume 30914 % POD/NR
Materials Reliability in Microelectronics III: Volume 309
By: William F. Filter, Paul S. (University of Texas, Austin) Ho, Harold J. (Dartmouth College, New Hampshire) Frost, Harold J Frost, Kenneth P Rodbell
Publisher: Cambridge University Press
No Review Yet
₹2,975
₹2,559
Binding:
Paperback
Release:
05 Jun 2014
Language:
English
International Edition
Ships within 14-16 Days Explain..
Free Shipping in India and low cost Worldwide.
Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
3.
Materials Reliability in Microelectronics V: Volume 391NR
Materials Reliability in Microelectronics V: Volume 391
By: William F. Filter, Kamesh Gadepally, Robert Rosenberg, Robert (IBM T J Watson Research Center, New York) Rosenberg, A. Lindsay (University of Cambridge) Greer
Publisher: Materials Research Society
No Review Yet
₹2,189
Binding:
Hardback
Release:
24 Oct 1995
Language:
English
Out of Stock
Notify me when this book is in stockNotify Me
4.
Materials Reliability in Microelectronics IV: Volume 338NR
Materials Reliability in Microelectronics IV: Volume 338
By: Peter Borgesen, William F. Filter, Kenneth P. Rodbell, John C. Coburn, John E., Jr. Sanchez
Publisher: Materials Research Society
No Review Yet
₹2,270
Binding:
Hardback
Release:
19 Oct 1994
Language:
English
Out of Stock
Notify me when this book is in stockNotify Me
5.
Materials Reliability in Microelectronics VI : Volume 428NR
Materials Reliability in Microelectronics VI : Volume 428
By: Anthony S. Oates, William F. Filter, Robert Rosenberg, Robert (IBM T J Watson Research Center, New York) Rosenberg, J Joseph Clement
Publisher: Materials Research Society
No Review Yet
₹2,251
Binding:
Hardback
Release:
18 Nov 1996
Language:
English
Out of Stock
Notify me when this book is in stockNotify Me
No more records found