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1.
Backdoor Attacks Against Learning-Based Algorithms37 %
Backdoor Attacks Against Learning-Based Algorithms
By: Haojin Zhu, Xuemin (Sherman) Shen, Shen, Shaofeng Li, Wen Wu
Publisher: Springer Nature Switzerland
No Review Yet
₹13,950
₹8,789
Binding:
Hardback
Release:
15 May 2024
Language:
English
Available
Ships within 12-14 Days Explain..
2.
Rapid On-Site Evaluation (Rose) in Diagnostic Interventional Pulmonology38 %
Rapid On-Site Evaluation (Rose) in Diagnostic Interventional Pulmonology
By: Chen Meng, Wen Li, Bo Wu, Jing Feng, Erlie Jiang
Publisher: Springer
No Review Yet
₹13,020
₹8,072
Binding:
Paperback
Release:
14 Jun 2021
Language:
English
Available
Ships within 1-2 Days Explain..
3.
Rapid On-Site Evaluation (Rose) in Diagnostic Interventional Pulmonology21 %
Rapid On-Site Evaluation (Rose) in Diagnostic Interventional Pulmonology
By: Chen Meng, Wen Li, Bo Wu, Jing Feng, Erlie Jiang
Publisher: Springer
No Review Yet
₹19,200
₹15,168
Binding:
Hardback
Release:
31 May 2020
Language:
English
Available
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4.
Materials, Processes, Integration and Reliability in Advanced Interconnects for Micro- and Nanoelectronics: Volume 99016 % POD/NR
Materials, Processes, Integration and Reliability in Advanced Interconnects for Micro- and Nanoelectronics: Volume 990
By: E. Todd Ryan, Wen-Li Wu, Qinghuang Lin, Do Yeung Yoon, E Todd Ryan
Publisher: Cambridge University Press
No Review Yet
₹3,045
₹2,558
Binding:
Paperback
Release:
05 Jun 2014
Language:
English
International Edition
Ships within 14-16 Days Explain..
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Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
5.
Materials, Processes, Integration and Reliability in Advanced Interconnects for Micro- and Nanoelectronics: Volume 990NR
Materials, Processes, Integration and Reliability in Advanced Interconnects for Micro- and Nanoelectronics: Volume 990
By: D. Y. Yoon, Q. Lin, E. T. Ryan, E. Todd Ryan, Wen-Li Wu
Publisher: Cambridge University Press
No Review Yet
₹2,564
Binding:
Hardcover
Release:
12 Sep 2007
Language:
English
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