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Ugo Valdre

Ugo Valdre

4 results found
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1.
Surface and Interface Characterization by Electron Optical Methods37 %
Surface and Interface Characterization by Electron Optical Methods
By: Ugo Valdre
Publisher: Springer
No Review Yet
₹4,800
₹3,024
Binding:
Paperback
Release:
25 Nov 2012
Language:
English
Available
Ships within 12-14 Days Explain..
2.
Impact of Electron and Scanning Probe Microscopy on Materials Research37 %
Impact of Electron and Scanning Probe Microscopy on Materials Research
By: David G. Rickerby, Giovanni Valdre, Ugo Valdre, David G Rickerby, Giovanni (Dept. of Earth and Geo-Environmental Sciences, University of Bologna, Italy) Valdre
Publisher: Springer
No Review Yet
₹9,600
₹6,048
Binding:
Hardback
Release:
31 Oct 1999
Language:
English
Available
Ships within 12-14 Days Explain..
3.
Impact of Electron and Scanning Probe Microscopy on Materials Research37 %
Impact of Electron and Scanning Probe Microscopy on Materials Research
By: David G. Rickerby, Giovanni Valdre, Ugo Valdre, David G Rickerby, Giovanni (Dept. of Earth and Geo-Environmental Sciences, University of Bologna, Italy) Valdre
Publisher: Springer
No Review Yet
₹9,600
₹6,048
Binding:
Paperback
Release:
30 Sep 1999
Language:
English
Available
Ships within 12-14 Days Explain..
4.
Surface and Interface Characterization by Electron Optical Methods1 % NR
Surface and Interface Characterization by Electron Optical Methods
By: Valdre Ugo Valdre
Publisher: Springer Nature B.V.
No Review Yet
₹4,239
₹4,197
Binding:
Paperback
Release:
13 Feb 2014
Language:
English
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