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Thomas N. Marieb

Thomas N. Marieb

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Materials Reliability in Microelectronics VIII: Volume 516NR
Materials Reliability in Microelectronics VIII: Volume 516
By: James R. Lloyd, Thomas N. Marieb, John C. (Stanford University, California) Bravman, Matti A. (Cornell University, New York) Korhonen, James R Lloyd
Publisher: Materials Research Society
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₹2,148
Binding:
Hardback
Release:
11 Nov 1998
Language:
English
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