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Thomas B Getz

Thomas B Getz

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Radiation Induced Fault Detection, Diagnosis, and Characterization on FPGAs3 % POD/NR
Radiation Induced Fault Detection, Diagnosis, and Characterization on FPGAs
By: Thomas B Getz
Publisher: BiblioBazaar, LLC
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₹1,444
₹1,401
Binding:
Paperback
Release:
04 Dec 2012
Language:
English
International Edition
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Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
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