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The National Institute of Standards and

The National Institute of Standards and

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1.
Fundamentals of Forensic DNA TypingPOD/NR
Fundamentals of Forensic DNA Typing
By: John M. Butler, John M Butler, John M. (National Institute of Standards and Technology, Gaithersburg, Maryland, USA) Butler, John M. (NIST Fellow and Special Assistant to the Director for Forensic Science, Office of Special Programs, at the U.S. National Institute of Standards and Technology, in Gaithersburg, Maryland.) Butler
Publisher: Elsevier Science Publishing Co Inc
No Review Yet
₹4,377
Binding:
Paperback
Release:
20 Aug 2009
Language:
English
International Edition
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Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
2.
Advanced Topics in Forensic DNA Typing: InterpretationNR
Advanced Topics in Forensic DNA Typing: Interpretation
By: John M. Butler, John M Butler, John M., Ph.D. (Analytical Chemistry), University of Virginia (National Institute of Standards and Technology (NIST), Gaithersburg, MD, USA) Butler
Publisher: Academic Press
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₹9,097
Binding:
Hardback
Release:
08 Oct 2014
Language:
English
International Edition
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3.
Introduction to Privacy Engineering and Risk Management in Federal Systems7 % POD/NR
Introduction to Privacy Engineering and Risk Management in Federal Systems
By: National Institute of Standards and Technology (Corporate Author), National Institute of Standards
Publisher: Createspace Independent Publishing Platform
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₹1,366
₹1,270
Binding:
Paperback
Release:
31 Jan 2017
Language:
English
International Edition
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Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
4.
Mutation, Randomness, and Evolution32 %
Mutation, Randomness, and Evolution
By: Arlin Stoltzfus, Stoltzfus, Dr Arlin (Research Biologist, Research Biologist, National Institute of Standards and Technology, Gaithersburg, Maryland, USA) Stoltzfus
Publisher: Oxford University Press
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₹4,491
₹3,054
Binding:
Paperback
Release:
25 May 2023
Language:
English
Available
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5.
CRC Handbook of Basic Tables for Chemical Analysis38 %
CRC Handbook of Basic Tables for Chemical Analysis
By: Paris D.N. Svoronos, Thomas J. Bruno, Thomas J Bruno, Thomas J. (National Institute of Standards and Technology, Boulder, Colorado, USA) Bruno, Paris D N Svoronos
Publisher: Taylor & Francis Ltd
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₹8,646
₹5,361
Binding:
Paperback
Release:
01 Aug 2022
Language:
English
Available
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6.
CRC Handbook of Basic Tables for Chemical Analysis49 %
CRC Handbook of Basic Tables for Chemical Analysis
By: Paris D.N. Svoronos, Thomas J. Bruno, Thomas J Bruno, Thomas J. (National Institute of Standards and Technology, Boulder, Colorado, USA) Bruno, Paris D N Svoronos
Publisher: Taylor and Francis
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₹24,706
₹12,600
Binding:
Hardback
Release:
31 Jul 2020
Language:
English
Available
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7.
A Century of Excellence in Measurements, Standards, and Technology41 %
A Century of Excellence in Measurements, Standards, and Technology
By: David R. Lide, David R Lide, David R. (National Institute of Standards & Technology (Retired), Gaithersburg, Maryland, USA) Lide
Publisher: CRC Press
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₹16,650
₹9,824
Binding:
Hardback
Release:
16 Apr 2018
Language:
English
Available
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8.
Coexistence in Wireless Networks38 %
Coexistence in Wireless Networks
By: Nada Golmie, Nada (National Institute of Standards and Technology, Maryland) Golmie
Publisher: Cambridge University Press
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₹8,648
₹5,362
Binding:
Hardback
Release:
01 Sep 2006
Language:
English
Available
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9.
From the Outer Heliosphere to the Local Bubble37 %
From the Outer Heliosphere to the Local Bubble
By: J. L. Linsky, E. Mobius, V. V. Izmodenov, Rudolf von Steiger, Jeffrey L. (National Institute of Standards and Te Linsky
Publisher: Springer-Verlag New York Inc.
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₹14,400
₹9,072
Binding:
Paperback
Release:
25 Nov 2014
Language:
English
Available
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10.
Neutron Scattering in Materials Science II: Volume 37643 %
Neutron Scattering in Materials Science II: Volume 376
By: Thomas P. (IBM Almaden Research Center, New York) Russell, Thomas P Russell, Dan A Neumann, Bernhardt J. (Massachusetts Institute of Technology) Wuensch, Dan A. (National Institute of Standards and Technology, Maryland) Neumann
Publisher: Materials Research Society
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₹6,753
₹3,849
Binding:
Hardback
Release:
14 Feb 1996
Language:
English
Available
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11.
Applications of Scanned Probe Microscopy to Polymers54 %
Applications of Scanned Probe Microscopy to Polymers
By: Gilbert C Walker, James D Batteas, Chris A. (Research Chemist, National Institute of Standards and Technology) Michaels, Gilbert C. (Professor of Chemistry, University of Pittsburgh) Walker, James D. (Research Chemist, National Institute of Standards and Technology) Batteas
Publisher: American Chemical Society
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₹28,064
₹12,909
Binding:
Hardback
Release:
01 Feb 2005
Language:
English
Available
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12.
Human Stress and the Environment34 %
Human Stress and the Environment
By: J Rose, Allen H. Rose, J. Rose , Allen H Rose, Allen H. (National Institute of Standards & Technology, Colorado, USA) Rose
Publisher: CRC Press
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₹42,500
₹28,050
Binding:
Hardback
Release:
23 Sep 1994
Language:
English
Available
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13.
Micro-Economics37 %
Micro-Economics
By: A Thomas, C. Abraham, D. V. Jones, C Abraham, A. (All of the National Institute for Biological Standards and Control, Potters Bar) Thomas
Publisher: Springer
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₹4,800
₹3,024
Binding:
Paperback
Release:
13 Jul 2013
Language:
English
Available
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14.
Metrology and Diagnostic Techniques for Nanoelectronics43 % NR
Metrology and Diagnostic Techniques for Nanoelectronics
By: David G. Seiler, Zhiyong Ma, David G Seiler, David G. (National Institute of Standards and Technology, Hillsboro, OR, USA) Seiler, Zhiyong (Intel Corporation, Hillsboro, OR, USA) Ma
Publisher: Pan Stanford Publishing
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₹44,200
₹25,194
Binding:
Hardback
Release:
03 Oct 2016
Language:
English
Available
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15.
CRC Handbook of Fundamental Spectroscopic Correlation Charts48 %
CRC Handbook of Fundamental Spectroscopic Correlation Charts
By: Paris D.N. Svoronos, Thomas J. Bruno, Paris D. N. Svoronos, Thomas J. (National Institute of Standards and Technology, Boulder, Colorado, USA) Bruno, Paris D.N. (City University of New York, Bayside, USA) Svoronos
Publisher: Taylor & Francis Inc
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₹12,915
₹6,716
Binding:
Paperback
Release:
31 Oct 2005
Language:
English
Available
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16.
Honoring Charlotte Moore Sitterly (Iau S371)11 % NR
Honoring Charlotte Moore Sitterly (Iau S371)
By: David R Soderblom, David R. (Space Telescope Science Institute, USA) Soderblom, Gillian (National Institute of Standards and Technology, Maryland) Nave, Gillian Nave
Publisher: Cambridge University Press
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₹12,325
₹10,969
Binding:
Hardback
Release:
29 Feb 2024
Language:
English
International Edition
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17.
Particle Strengths27 % NR
Particle Strengths
By: Cook, RF Cook, Robert F Cook, Robert F. (National Institute of Standards and Technology (NIST), MD, USA) Cook
Publisher: John Wiley & Sons Inc
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₹18,275
₹13,341
Binding:
Hardback
Release:
16 Aug 2023
Language:
English
International Edition
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18.
Modeling, Characterization, and Production of Nanomaterials17 % NR
Modeling, Characterization, and Production of Nanomaterials
By: Vinod Tewary, Yong Zhang, Yong (University of North Carolina, USA) Zhang, Vinod (National Institute of Standards and Technology (NIST)) Tewary
Publisher: Woodhead Publishing
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₹28,050
₹23,282
Binding:
Paperback
Release:
17 Jan 2021
Language:
English
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19.
Mutation, Randomness, and Evolution5 % NR
Mutation, Randomness, and Evolution
By: Arlin Stoltzfus, Arlin (Fellow, Fellow, Institute for Bioscience and Biotechnology Research, Rockville, Maryland, USA) Stoltzfus, Dr Arlin (Research Biologist, Research Biologist, National Institute of Standards and Technology, Gaithersburg, Maryland, USA) Stoltzfus
Publisher: Oxford University Press, USA
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₹9,657
₹9,174
Binding:
Hardback
Release:
25 May 2021
Language:
English
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20.
DNA Damage, DNA Repair and Disease11 % NR
DNA Damage, DNA Repair and Disease
By: Miral Dizdaroglu, R Stephen Lloyd, Miral (National Institute of Standards and Technology) Dizdaroglu, R Stephen (Oregon Health & Science University, USA) Lloyd
Publisher: RSC Publishing
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₹18,337
₹16,320
Binding:
Hardback
Release:
18 Nov 2020
Language:
English
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