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The National Institute of Standards and

The National Institute of Standards and

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1.
Fundamentals of Forensic DNA Typing6 % POD/NR
Fundamentals of Forensic DNA Typing
By: John M. Butler, John M Butler, John M. (National Institute of Standards and Technology, Gaithersburg, Maryland, USA) Butler, John M. (NIST Fellow and Special Assistant to the Director for Forensic Science, Office of Special Programs, at the U.S. National Institute of Standards and Technology, in Gaithersburg, Maryland.) Butler
Publisher: Elsevier Science Publishing Co Inc
No Review Yet
₹4,536
₹4,264
Binding:
Paperback
Release:
20 Aug 2009
Language:
English
International Edition
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Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
2.
Advanced Topics in Forensic DNA Typing: Interpretation5 % NR
Advanced Topics in Forensic DNA Typing: Interpretation
By: John M. Butler, John M Butler, John M., Ph.D. (Analytical Chemistry), University of Virginia (National Institute of Standards and Technology (NIST), Gaithersburg, MD, USA) Butler
Publisher: Academic Press
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₹8,571
₹8,142
Binding:
Hardback
Release:
08 Oct 2014
Language:
English
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3.
Advanced Topics in Forensic DNA Typing: Methodology10 % NR
Advanced Topics in Forensic DNA Typing: Methodology
By: John M Butler, John M., Ph.D. (Analytical Chemistry), University of Virginia (National Institute of Standards and Technology (NIST), Gaithersburg, MD, USA) Butler
Publisher: Academic Press
4.1 (7)
₹9,212
₹8,291
Binding:
Hardback
Release:
21 Jul 2011
Language:
English
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4.
Introduction to Privacy Engineering and Risk Management in Federal Systems7 % POD/NR
Introduction to Privacy Engineering and Risk Management in Federal Systems
By: National Institute of Standards and Technology (Corporate Author), National Institute of Standards
Publisher: Createspace Independent Publishing Platform
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₹1,366
₹1,270
Binding:
Paperback
Release:
31 Jan 2017
Language:
English
International Edition
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Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
5.
Mutation, Randomness, and Evolution32 %
Mutation, Randomness, and Evolution
By: Arlin Stoltzfus, Stoltzfus, Dr Arlin (Research Biologist, Research Biologist, National Institute of Standards and Technology, Gaithersburg, Maryland, USA) Stoltzfus
Publisher: Oxford University Press
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₹4,559
₹3,100
Binding:
Paperback
Release:
25 May 2023
Language:
English
Available
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6.
CRC Handbook of Basic Tables for Chemical Analysis38 %
CRC Handbook of Basic Tables for Chemical Analysis
By: Paris D.N. Svoronos, Thomas J. Bruno, Thomas J Bruno, Thomas J. (National Institute of Standards and Technology, Boulder, Colorado, USA) Bruno, Paris D N Svoronos
Publisher: Taylor & Francis Ltd
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₹8,777
₹5,442
Binding:
Paperback
Release:
01 Aug 2022
Language:
English
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7.
CRC Handbook of Basic Tables for Chemical Analysis47 %
CRC Handbook of Basic Tables for Chemical Analysis
By: Paris D.N. Svoronos, Thomas J. Bruno, Thomas J Bruno, Thomas J. (National Institute of Standards and Technology, Boulder, Colorado, USA) Bruno, Paris D N Svoronos
Publisher: Taylor and Francis
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₹23,310
₹12,354
Binding:
Hardback
Release:
31 Jul 2020
Language:
English
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8.
A Century of Excellence in Measurements, Standards, and Technology47 %
A Century of Excellence in Measurements, Standards, and Technology
By: David R. Lide, David R Lide, David R. (National Institute of Standards & Technology (Retired), Gaithersburg, Maryland, USA) Lide
Publisher: CRC Press
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₹16,650
₹8,825
Binding:
Hardback
Release:
16 Apr 2018
Language:
English
Available
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9.
Coexistence in Wireless Networks38 %
Coexistence in Wireless Networks
By: Nada Golmie, Nada (National Institute of Standards and Technology, Maryland) Golmie
Publisher: Cambridge University Press
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₹8,778
₹5,442
Binding:
Hardback
Release:
01 Sep 2006
Language:
English
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10.
From the Outer Heliosphere to the Local Bubble37 %
From the Outer Heliosphere to the Local Bubble
By: J. L. Linsky, E. Mobius, V. V. Izmodenov, Rudolf von Steiger, Jeffrey L. (National Institute of Standards and Te Linsky
Publisher: Springer-Verlag New York Inc.
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₹14,400
₹9,072
Binding:
Paperback
Release:
25 Nov 2014
Language:
English
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11.
Neutron Scattering in Materials Science II: Volume 37643 %
Neutron Scattering in Materials Science II: Volume 376
By: Thomas P. (IBM Almaden Research Center, New York) Russell, Thomas P Russell, Dan A Neumann, Bernhardt J. (Massachusetts Institute of Technology) Wuensch, Dan A. (National Institute of Standards and Technology, Maryland) Neumann
Publisher: Materials Research Society
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₹6,738
₹3,841
Binding:
Hardback
Release:
14 Feb 1996
Language:
English
Available
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12.
Applications of Scanned Probe Microscopy to Polymers54 %
Applications of Scanned Probe Microscopy to Polymers
By: Gilbert C Walker, James D Batteas, Chris A. (Research Chemist, National Institute of Standards and Technology) Michaels, Gilbert C. (Professor of Chemistry, University of Pittsburgh) Walker, James D. (Research Chemist, National Institute of Standards and Technology) Batteas
Publisher: American Chemical Society
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₹28,000
₹12,880
Binding:
Hardback
Release:
01 Feb 2005
Language:
English
Available
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13.
Human Stress and the Environment44 %
Human Stress and the Environment
By: J Rose, Allen H. Rose, J. Rose , Allen H Rose, Allen H. (National Institute of Standards & Technology, Colorado, USA) Rose
Publisher: CRC Press
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₹42,500
₹23,800
Binding:
Hardback
Release:
23 Sep 1994
Language:
English
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14.
Micro-Economics37 %
Micro-Economics
By: A Thomas, C. Abraham, D. V. Jones, C Abraham, A. (All of the National Institute for Biological Standards and Control, Potters Bar) Thomas
Publisher: Springer
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₹4,800
₹3,024
Binding:
Paperback
Release:
13 Jul 2013
Language:
English
Available
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15.
CRC Handbook of Fundamental Spectroscopic Correlation Charts47 %
CRC Handbook of Fundamental Spectroscopic Correlation Charts
By: Paris D.N. Svoronos, Thomas J. Bruno, Paris D. N. Svoronos, Thomas J. (National Institute of Standards and Technology, Boulder, Colorado, USA) Bruno, Paris D.N. (City University of New York, Bayside, USA) Svoronos
Publisher: Taylor & Francis Inc
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₹12,765
₹6,765
Binding:
Paperback
Release:
31 Oct 2005
Language:
English
Available
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16.
Metrology and Diagnostic Techniques for Nanoelectronics52 % NR
Metrology and Diagnostic Techniques for Nanoelectronics
By: David G. Seiler, Zhiyong Ma, David G Seiler, David G. (National Institute of Standards and Technology, Hillsboro, OR, USA) Seiler, Zhiyong (Intel Corporation, Hillsboro, OR, USA) Ma
Publisher: Pan Stanford Publishing
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₹44,200
₹21,216
Binding:
Hardback
Release:
03 Oct 2016
Language:
English
Available
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17.
Honoring Charlotte Moore Sitterly (Iau S371)6 % NR
Honoring Charlotte Moore Sitterly (Iau S371)
By: David R Soderblom, David R. (Space Telescope Science Institute, USA) Soderblom, Gillian (National Institute of Standards and Technology, Maryland) Nave, Gillian Nave
Publisher: Cambridge University Press
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₹12,375
₹11,633
Binding:
Hardback
Release:
29 Feb 2024
Language:
English
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18.
Particle Strengths27 % NR
Particle Strengths
By: Cook, RF Cook, Robert F Cook, Robert F. (National Institute of Standards and Technology (NIST), MD, USA) Cook
Publisher: John Wiley & Sons Inc
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₹18,338
₹13,387
Binding:
Hardback
Release:
16 Aug 2023
Language:
English
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19.
Modeling, Characterization, and Production of Nanomaterials13 % NR
Modeling, Characterization, and Production of Nanomaterials
By: Vinod Tewary, Yong Zhang, Yong (University of North Carolina, USA) Zhang, Vinod (National Institute of Standards and Technology (NIST)) Tewary
Publisher: Woodhead Publishing
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₹28,305
₹24,625
Binding:
Paperback
Release:
17 Jan 2021
Language:
English
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20.
Mutation, Randomness, and Evolution5 % NR
Mutation, Randomness, and Evolution
By: Arlin Stoltzfus, Arlin (Fellow, Fellow, Institute for Bioscience and Biotechnology Research, Rockville, Maryland, USA) Stoltzfus, Dr Arlin (Research Biologist, Research Biologist, National Institute of Standards and Technology, Gaithersburg, Maryland, USA) Stoltzfus
Publisher: Oxford University Press, USA
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₹10,013
₹9,512
Binding:
Hardback
Release:
25 May 2021
Language:
English
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