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Sudarshan Bahukudumbi

Sudarshan Bahukudumbi

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1.
Wafer-Level Testing and Test During Burn-In for Integrated Circuits43 %
Wafer-Level Testing and Test During Burn-In for Integrated Circuits
By: Krishnendu Chakrabarty , Sudarshan Bahukudumbi
Publisher: Artech House Publishers
No Review Yet
₹11,844
₹6,751
Binding:
Hardback
Release:
28 Feb 2010
Language:
English
Available
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2.
Wafer-Level Testing and Test During Burn-In for Integrated Circuits
Wafer-Level Testing and Test During Burn-In for Integrated Circuits
By: Krishnendu Chakrabarty , Sudarshan Bahukudumbi
Publisher: Artech House Publishers
No Review Yet
₹8,928
Binding:
Digital (delivered electronically)
Release:
01 Feb 2010
Language:
English
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