· FLAT 10% Off (Maximum Discount Rs.50) Use Code - BWSPECIAL10

· Grab Bestselling Books upto 50% Off!

· FLAT 10% Off (Maximum Discount Rs.50) Use Code - BWSPECIAL10

· Grab Bestselling Books upto 50% Off!

· FLAT 10% Off (Maximum Discount Rs.50) Use Code - BWSPECIAL10

· Grab Bestselling Books upto 50% Off!

Humburger Icon
Logo1
Login & Sign up
Bookswagon-24x7 online bookstore
AddBanner
Home icon Home
Account Icon Account
Wishlist Icon Wishlist
Cart Icon Cart
Bookswagon icon Categories
Close

Refine your Search

By Price

Availability

Shipping Time

Source

Binding

Language

Publication Year

Filter By Category
Sergio Ajuria

Sergio Ajuria

1 results found
List viewGrid view
Sort By:
1.
In-line Characterization Techniques for Performance and Yield Enhancement in Microelectronic ManufacturingNR
In-line Characterization Techniques for Performance and Yield Enhancement in Microelectronic Manufacturing
By: Damon K Debusk, Sergio Ajuria
Publisher: Spie Press
No Review Yet
₹9,692
Binding:
Paperback
Release:
01 Jan 1997
Out of Stock
Notify me when this book is in stockNotify Me
No more records found