Sarah Fearn

Sarah FearnDr. Sarah Fearn is a Research Officer, Surface Analysis in the Materials Department at Imperial College London, where she conducts near- surface analysis of SOFCs and ionic conductivity measurements on nano-engineered structures. Her current researchtechniques include: isotope exchange, secondary ion mass spectrometry (SIMS), focused ion beam (FIB) microscopy, and low-energy ion scattering (LEIS). She received her PhD in 1999 from Imperial College London and spent nearly two years as a commercial SIMS analyst with Cascade Scientific before joining ICL in 2002. Read More Read Less

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Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials ScienceNR
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Secondary Ion Mass Spectrometry and Its Application to Materials Science (Second Edition)32 % NR
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An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science
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