close menu
Bookswagon-24x7 online bookstore
close menu
My Account
Sandeep K Goel

Sandeep K Goel

5 results found
List viewGrid view
Sort By:
1.
Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits48 %
No Review Yet
₹10,167
₹5,287
Binding:
Paperback
Release:
29 Mar 2017
Language:
English
Available
Ships within 16-18 Days Explain..
2.
Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits
No Review Yet
₹13,003
Binding:
Hardback
Release:
25 Oct 2013
Language:
English
Available
Ships within 4-6 Days Explain..
3.
Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits
No Review Yet
₹8,792
Binding:
Digital (delivered electronically)
Release:
19 Dec 2017
Language:
English
Out of Stock
Notify me when this book is in stockNotify Me
4.
Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits
No Review Yet
₹10,539
Binding:
Digital (delivered electronically)
Release:
19 Dec 2017
Language:
English
Out of Stock
Notify me when this book is in stockNotify Me
No more records found
ASK VIDYA