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Sandeep K Goel

Sandeep K Goel

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1.
Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits42 %
Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits
By: Sandeep K. Goel, Chakrabarty Krishnendu, Krishnendu Chakrabarty , Sandeep K Goel, Krishnendu (Duke University, Durham, North Carolina, USA) Chakrabarty
Publisher: CRC Press
No Review Yet
₹21,250
₹12,325
Binding:
Hardback
Release:
25 Oct 2013
Language:
English
Available
Ships within 12-14 Days Explain..
2.
Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits47 %
Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits
By: Sandeep K. Goel, Chakrabarty Krishnendu, Krishnendu Chakrabarty , Sandeep K. Goel (Editor), Krishnendu Chakrabarty (Editor)
Publisher: CRC Press
No Review Yet
₹8,324
₹4,412
Binding:
Paperback
Release:
31 Mar 2017
Language:
English
Available
Ships within 12-14 Days Explain..
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