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S. (Duke University) Ozev

S. (Duke University) Ozev

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Design for Testability for RF Circuits and Systems20 % NR
Design for Testability for RF Circuits and Systems
By: Sule Ozev, Martin Margala, S. (Duke University) Ozev
Publisher: Springer-Verlag New York Inc.
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₹8,480
₹6,784
Binding:
Hardback
Release:
15 Jan 2017
Language:
English
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