Humburger Icon
Logo1
Login & Sign up
Bookswagon-24x7 online bookstore
AddBanner
Home icon Home
Account Icon Account
Wishlist Icon Wishlist
Cart Icon Cart
Bookswagon icon Categories
Close

Refine your Search

By Price

Availability

Shipping Time

Source

Binding

Language

Publication Year

Filter By Category
Ruijing Shen

Ruijing Shen

2 results found
List viewGrid view
Sort By:
1.
Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs37 %
Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs
By: Sheldon X. Tan, Ruijing Shen, Sheldon X. D. Tan, Hao Yu , Sheldon X Tan
Publisher: Springer-Verlag New York Inc.
No Review Yet
₹10,766
₹6,783
Binding:
Paperback
Release:
13 Apr 2014
Language:
English
Available
Ships within 12-14 Days Explain..
2.
Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs33 % POD/NR
Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs
By: Ruijing Shen, Sheldon X. D. Tan, Hao Yu , Sheldon X Tan, Sheldon X.-D. Tan
Publisher: Springer
No Review Yet
₹14,624
₹9,798
Binding:
Hardback
Release:
18 Mar 2012
Language:
English
International Edition
Ships within 14-16 Days Explain..
Free Shipping in India and low cost Worldwide.
Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
No more records found