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Ronald J Gutmann

Ronald J Gutmann

6 results found
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1.
On Risk and Disaster58 %
On Risk and Disaster
By: Donald F Kettl, Donald F. Kettl, Amy Gutmann, Ronald J. Daniels, Howard Kunreuther
Publisher: University of Pennsylvania Press
No Review Yet
₹2,020
₹848
Binding:
Paperback
Release:
06 Feb 2006
Language:
English
Available
Ships within 1-2 Days Explain..
2.
Chemical-Mechanical Polishing of Low Dielectric Constant Polymers and Organosilicate Glasses
Chemical-Mechanical Polishing of Low Dielectric Constant Polymers and Organosilicate Glasses
By: Christopher Lyle Borst, Christopher Borst, William N. Gill, Ronald J. Gutmann, Ronald J Gutmann
Publisher: Springer
No Review Yet
₹2,417
Binding:
Hardback
Release:
30 Sep 2002
Language:
English
Available
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3.
Chemical-Mechanical Polishing of Low Dielectric Constant Polymers and Organosilicate Glasses37 %
Chemical-Mechanical Polishing of Low Dielectric Constant Polymers and Organosilicate Glasses
By: Christopher Lyle Borst, Christopher Borst, William N. Gill, Ronald J. Gutmann, Ronald J Gutmann
Publisher: Springer
No Review Yet
₹14,400
₹9,072
Binding:
Paperback
Release:
23 Feb 2014
Language:
English
Available
Ships within 12-14 Days Explain..
4.
Wafer Level 3-D ICS Process Technology37 %
Wafer Level 3-D ICS Process Technology
By: Chuan Seng Tan, L. Rafael Reif, Ronald J. Gutmann, L Rafael Reif, Ronald J Gutmann
Publisher: Springer
No Review Yet
₹14,400
₹9,072
Binding:
Paperback
Release:
08 Dec 2010
Language:
English
Available
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5.
Wafer Level 3-D ICS Process Technology48 %
Wafer Level 3-D ICS Process Technology
By: Chuan Seng Tan, L. Rafael Reif, Ronald J. Gutmann, L Rafael Reif, Ronald J Gutmann
Publisher: Springer
No Review Yet
₹14,579
₹7,581
Binding:
Hardback
Release:
19 Sep 2008
Language:
English
Available
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6.
Chemical Mechanical Planarization of Microelectronic Materials4 % NR
Chemical Mechanical Planarization of Microelectronic Materials
By: Joseph M Steigerwald, Shyam P Murarka, Ronald J Gutmann
Publisher: Wiley
No Review Yet
₹16,359
₹15,771
Binding:
Online resource
Release:
21 Dec 2007
Language:
English
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