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Ronald D. Schrimpf

Ronald D. Schrimpf

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1.
Defects in Microelectronic Materials and DevicesPOD/NR
Defects in Microelectronic Materials and Devices
By: Ronald D. Schrimpf, Daniel M. Fleetwood, Daniel M Fleetwood, Ronald D Schrimpf
Publisher: Taylor and Francis
No Review Yet
₹7,142
Binding:
Paperback
Release:
07 Oct 2019
Language:
English
International Edition
Ships within 18-20 Days Explain..
Free Shipping in India and low cost Worldwide.
Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
2.
Radiation Effects & Soft Errors ...(V34)POD/NR
Radiation Effects & Soft Errors ...(V34)
By: Ronald D. Schrimpf, Daniel M. Fleetwood, Daniel M Fleetwood, Ronald D Schrimpf, Ronald D (Vanderbilt Univ, Usa) Schrimpf
Publisher: World Scientific Publishing Company
No Review Yet
₹14,364
Binding:
Hardback
Release:
03 Aug 2004
Language:
English
International Edition
Ships within 12-14 Days Explain..
Free Shipping in India and low cost Worldwide.
Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
3.
Defects in Microelectronic Materials and Devices41 % NR
Defects in Microelectronic Materials and Devices
By: Ronald D. Schrimpf, Daniel M. Fleetwood, Daniel M Fleetwood, Ronald D Schrimpf, Daniel M. (Vanderbilt University, Nashville, Tennessee) Fleetwood
Publisher: CRC Press
No Review Yet
₹20,813
₹12,280
Binding:
Hardback
Release:
19 Nov 2008
Language:
English
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