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Robert Seiler

Robert Seiler

15 results found
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1.
Frontiers of Characterization and Metrology for Nanoelectronics
Frontiers of Characterization and Metrology for Nanoelectronics
By: Robert McDonald, David G Seiler, Alain C Diebold, C Michael Garner, Dan Herr
Publisher: American Institute of Physics
No Review Yet
₹5,474
Binding:
SF
Release:
26 Oct 2009
Language:
English
Available
Ships within 4-6 Days Explain..
2.
Collected Works of Walter Pater, Vol. IX: CorrespondenceNR
Collected Works of Walter Pater, Vol. IX: Correspondence
By: Seiler, Robert Seiler, Robert (Associate Professor, Emeritus, Associate Professor, Emeritus, University of Calgary) Seiler
Publisher: Oxford University Press
No Review Yet
₹21,533
Binding:
Hardback
Release:
22 Dec 2022
Language:
English
International Edition
Ships within 18-20 Days Explain..
Free Shipping in India and low cost Worldwide.
3.
Book Beautiful18 % POD/NR
Book Beautiful
By: Robert M Seiler, Robert M. Seiler
Publisher: Bloomsbury Publishing PLC
No Review Yet
₹15,960
₹13,087
Binding:
Hardback
Release:
08 May 2014
Language:
English
International Edition
Ships within 14-16 Days Explain..
Free Shipping in India and low cost Worldwide.
Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
4.
Living in Motion17 % NR
Living in Motion
By: Stephanie Bunn, Alexander Von Vegesack, Mathias Schwartz-Clauss, Robert Kronenburg, Annemarie Seiler-Baldinger
Publisher: Vitra Design Museum
No Review Yet
₹5,036
₹4,180
Binding:
Paperback
Release:
30 Sep 2013
Language:
English
International Edition
Ships within 24-26 Days Explain..
Free Shipping in India and low cost Worldwide.
5.
Characterization and Metrology for ULSI Technology38 %
Characterization and Metrology for ULSI Technology
By: Robert McDonald, W Murray Bullis, E Jane Walters, David G Seiler, Alain C Diebold
Publisher: American Institute of Physics
No Review Yet
₹13,650
₹8,463
Binding:
SF
Release:
14 Dec 1998
Language:
English
Out of Stock
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6.
Characterization and Metrology for ULSI Technology 200533 %
Characterization and Metrology for ULSI Technology 2005
By: Stefan Zollner, Robert McDonald, David G Seiler, D G Seiler, Alain C Diebold
Publisher: Springer
No Review Yet
₹26,347
₹17,652
Binding:
Hardback
Release:
01 Sep 2005
Language:
English
Out of Stock
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7.
Reel TimeNR
Reel Time
By: Robert M Seiler, Robert M. Seiler, Tamara P. Seiler
Publisher: UBC Press
No Review Yet
₹3,022
Binding:
Paperback
Release:
01 Dec 2012
Language:
English
Out of Stock
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8.
London and Lancashire Insurance Company, Ltd., Petitioner, V. Gas Service Company. U.S. Supreme Court Transcript of Record with Supporting Pleadings4 % POD/NR
London and Lancashire Insurance Company, Ltd., Petitioner, V. Gas Service Company. U.S. Supreme Court Transcript of Record with Supporting Pleadings
By: Robert E Seiler, Jerome T Duggan
Publisher: Gale, U.S. Supreme Court Records
No Review Yet
₹1,899
₹1,814
Binding:
Paperback
Release:
28 Oct 2011
Language:
English
Out of Stock
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Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
9.
Options, Futures and Other DerivativesNR
Options, Futures and Other Derivatives
By: Michael J. Seiler, John Hull, Robert A. Haugen, John Nofsinger
Publisher: Pearson Education Limited
No Review Yet
₹11,857
Binding:
Multiple copy pack
Release:
28 Jul 2004
Out of Stock
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10.
Handbook of Pottery of the Egyptian Middle KingdomNR
Handbook of Pottery of the Egyptian Middle Kingdom
By: Robert Schiestl, Anne Seiler
Publisher: Austrian Academy of Sciences
No Review Yet
₹31,128
Binding:
Hardback
Release:
03 Aug 2012
Language:
English
Out of Stock
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11.
Frontiers of Characterization and Metrology for NanoelectronicsNR
Frontiers of Characterization and Metrology for Nanoelectronics
By: Robert McDonald, David G Seiler, Alain C Diebold, C Michael Garner, Dan Herr
Publisher: American Institute of Physics
No Review Yet
₹15,975
Binding:
SF
Release:
01 Sep 2007
Language:
English
Out of Stock
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12.
A. F. Brooks, Doing Business as East Side Ice and Fuel Company, Et Al., Petitioners, V. State Farm Mutual Automobile Insurance Company. U.S. Supreme Court Transcript of Record with Supporting Pleadings4 % POD/NR
A. F. Brooks, Doing Business as East Side Ice and Fuel Company, Et Al., Petitioners, V. State Farm Mutual Automobile Insurance Company. U.S. Supreme Court Transcript of Record with Supporting Pleadings
By: Helen Redding, Robert E Seiler
Publisher: Gale, U.S. Supreme Court Records
No Review Yet
₹1,899
₹1,816
Binding:
Paperback
Release:
27 Oct 2011
Language:
English
Out of Stock
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Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
13.
Characterization and Metrology for ULSI Technology 2000NR
Characterization and Metrology for ULSI Technology 2000
By: , Robert McDonald, W Murray Bullis, Patrick J Smith, David G Seiler
Publisher: American Institute of Physics
No Review Yet
₹16,609
Binding:
SF
Release:
01 Mar 2001
Language:
English
Out of Stock
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14.
Characterization and Metrology for ULSI TechnologyNR
Characterization and Metrology for ULSI Technology
By: Stefan Zollner, Robert McDonald, David G Seiler, Alain C Diebold, Eric M Secula
Publisher: American Institute of Physics
No Review Yet
₹18,805
Binding:
SF
Release:
08 Oct 2003
Language:
English
Out of Stock
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15.
Frontiers of Characterization and Metrology for Nanoelectronics: 2011NR
Frontiers of Characterization and Metrology for Nanoelectronics: 2011
By: Amal Chabli, Robert McDonald, David G Seiler, Alain C Diebold, Erik M Secula
Publisher: American Institute of Physics
No Review Yet
₹16,603
Binding:
Book
Release:
26 Apr 2012
Language:
English
Out of Stock
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