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Robert M. Seiler

Robert M. SeilerRobert M. Seiler, University of Calgary

9 results found
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1.
Frontiers of Characterization and Metrology for Nanoelectronics
Frontiers of Characterization and Metrology for Nanoelectronics
By: Robert McDonald, David G Seiler, Alain C Diebold, C Michael Garner, Dan Herr
Publisher: American Institute of Physics
No Review Yet
₹5,474
Binding:
SF
Release:
26 Oct 2009
Language:
English
Available
Ships within 4-6 Days Explain..
2.
The Book Beautiful22 % POD/NR
The Book Beautiful
By: Robert M Seiler, Robert M. Seiler
Publisher: Bloomsbury Publishing PLC
No Review Yet
₹16,720
₹13,042
Binding:
Hardback
Release:
08 May 2014
Language:
English
International Edition
Ships within 12-14 Days Explain..
Free Shipping in India and low cost Worldwide.
Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
3.
Characterization and Metrology for ULSI Technology38 %
Characterization and Metrology for ULSI Technology
By: Robert McDonald, W Murray Bullis, E Jane Walters, David G Seiler, Alain C Diebold
Publisher: American Institute of Physics
No Review Yet
₹13,650
₹8,463
Binding:
SF
Release:
14 Dec 1998
Language:
English
Out of Stock
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4.
Characterization and Metrology for ULSI Technology 200533 %
Characterization and Metrology for ULSI Technology 2005
By: Stefan Zollner, Robert McDonald, David G Seiler, D G Seiler, Alain C Diebold
Publisher: Springer
No Review Yet
₹26,347
₹17,652
Binding:
Hardback
Release:
01 Sep 2005
Language:
English
Out of Stock
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5.
Reel TimeNR
Reel Time
By: Robert M Seiler, Robert M. Seiler, Tamara P. Seiler
Publisher: UBC Press
No Review Yet
₹3,022
Binding:
Paperback
Release:
01 Dec 2012
Language:
English
Out of Stock
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6.
Frontiers of Characterization and Metrology for NanoelectronicsNR
Frontiers of Characterization and Metrology for Nanoelectronics
By: Robert McDonald, David G Seiler, Alain C Diebold, C Michael Garner, Dan Herr
Publisher: American Institute of Physics
No Review Yet
₹15,975
Binding:
SF
Release:
01 Sep 2007
Language:
English
Out of Stock
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7.
Characterization and Metrology for ULSI Technology 2000NR
Characterization and Metrology for ULSI Technology 2000
By: , Robert McDonald, W Murray Bullis, Patrick J Smith, David G Seiler
Publisher: American Institute of Physics
No Review Yet
₹16,609
Binding:
SF
Release:
01 Mar 2001
Language:
English
Out of Stock
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8.
Characterization and Metrology for ULSI TechnologyNR
Characterization and Metrology for ULSI Technology
By: Stefan Zollner, Robert McDonald, David G Seiler, Alain C Diebold, Eric M Secula
Publisher: American Institute of Physics
No Review Yet
₹18,805
Binding:
SF
Release:
08 Oct 2003
Language:
English
Out of Stock
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9.
Frontiers of Characterization and Metrology for Nanoelectronics: 2011NR
Frontiers of Characterization and Metrology for Nanoelectronics: 2011
By: Amal Chabli, Robert McDonald, David G Seiler, Alain C Diebold, Erik M Secula
Publisher: American Institute of Physics
No Review Yet
₹16,603
Binding:
Book
Release:
26 Apr 2012
Language:
English
Out of Stock
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