Humburger Icon
Logo1
Login & Sign up
Bookswagon-24x7 online bookstore
AddBanner
Home icon Home
Account Icon Account
Wishlist Icon Wishlist
Cart Icon Cart
Bookswagon icon Categories
Close

Refine your Search

By Price

Availability

Shipping Time

Source

Binding

Language

Publication Year

Filter By Category
Robert M. Seiler

Robert M. Seiler

9 results found
List viewGrid view
Sort By:
1.
Frontiers of Characterization and Metrology for Nanoelectronics
Frontiers of Characterization and Metrology for Nanoelectronics
By: Robert McDonald, David G Seiler, Alain C Diebold, C Michael Garner, Dan Herr
Publisher: American Institute of Physics
No Review Yet
₹5,474
Binding:
SF
Release:
26 Oct 2009
Language:
English
Available
Ships within 4-6 Days Explain..
2.
Book Beautiful18 % POD/NR
Book Beautiful
By: Robert M Seiler, Robert M. Seiler
Publisher: Bloomsbury Publishing PLC
No Review Yet
₹15,960
₹13,087
Binding:
Hardback
Release:
08 May 2014
Language:
English
International Edition
Ships within 14-16 Days Explain..
Free Shipping in India and low cost Worldwide.
Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
3.
Characterization and Metrology for ULSI Technology38 %
Characterization and Metrology for ULSI Technology
By: Robert McDonald, W Murray Bullis, E Jane Walters, David G Seiler, Alain C Diebold
Publisher: American Institute of Physics
No Review Yet
₹13,650
₹8,463
Binding:
SF
Release:
14 Dec 1998
Language:
English
Out of Stock
Notify me when this book is in stockNotify Me
4.
Characterization and Metrology for ULSI Technology 200533 %
Characterization and Metrology for ULSI Technology 2005
By: Stefan Zollner, Robert McDonald, David G Seiler, D G Seiler, Alain C Diebold
Publisher: Springer
No Review Yet
₹26,347
₹17,652
Binding:
Hardback
Release:
01 Sep 2005
Language:
English
Out of Stock
Notify me when this book is in stockNotify Me
5.
Reel TimeNR
Reel Time
By: Robert M Seiler, Robert M. Seiler, Tamara P. Seiler
Publisher: UBC Press
No Review Yet
₹3,022
Binding:
Paperback
Release:
01 Dec 2012
Language:
English
Out of Stock
Notify me when this book is in stockNotify Me
6.
Frontiers of Characterization and Metrology for NanoelectronicsNR
Frontiers of Characterization and Metrology for Nanoelectronics
By: Robert McDonald, David G Seiler, Alain C Diebold, C Michael Garner, Dan Herr
Publisher: American Institute of Physics
No Review Yet
₹15,975
Binding:
SF
Release:
01 Sep 2007
Language:
English
Out of Stock
Notify me when this book is in stockNotify Me
7.
Characterization and Metrology for ULSI Technology 2000NR
Characterization and Metrology for ULSI Technology 2000
By: , Robert McDonald, W Murray Bullis, Patrick J Smith, David G Seiler
Publisher: American Institute of Physics
No Review Yet
₹16,609
Binding:
SF
Release:
01 Mar 2001
Language:
English
Out of Stock
Notify me when this book is in stockNotify Me
8.
Characterization and Metrology for ULSI TechnologyNR
Characterization and Metrology for ULSI Technology
By: Stefan Zollner, Robert McDonald, David G Seiler, Alain C Diebold, Eric M Secula
Publisher: American Institute of Physics
No Review Yet
₹18,805
Binding:
SF
Release:
08 Oct 2003
Language:
English
Out of Stock
Notify me when this book is in stockNotify Me
9.
Frontiers of Characterization and Metrology for Nanoelectronics: 2011NR
Frontiers of Characterization and Metrology for Nanoelectronics: 2011
By: Amal Chabli, Robert McDonald, David G Seiler, Alain C Diebold, Erik M Secula
Publisher: American Institute of Physics
No Review Yet
₹16,603
Binding:
Book
Release:
26 Apr 2012
Language:
English
Out of Stock
Notify me when this book is in stockNotify Me
No more records found