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Rajpal S. Sirohi

Rajpal S. Sirohi

8 results found
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1.
Introduction to Optical Metrology33 %
Introduction to Optical Metrology
By: Rajpal S. Sirohi, Rajpal S Sirohi, Rajpal S. (Tezpur University, India) Sirohi, Rajpal (Austin, Texas, USA) Sirohi, Rajpal S. (Austin, Texas, USA) Sirohi
Publisher: CRC Press
No Review Yet
₹11,087
₹7,428
Binding:
Hardback
Release:
20 Aug 2015
Language:
English
Available
Ships within 2-4 Days Explain..
2.
Optical Components, Techniques, and Systems in Engineering33 %
Optical Components, Techniques, and Systems in Engineering
By: R S Sirohi, Rajpal S. Sirohi, R. S. Sirohi, Mahendra P. Kothiyal, Rajpal S Sirohi
Publisher: CRC Press
No Review Yet
₹29,175
₹19,547
Binding:
Hardback
Release:
18 Dec 1990
Language:
English
Available
Ships within 2-4 Days Explain..
3.
Speckle Metrology41 %
Speckle Metrology
By: R S Sirohi, Rajpal S. (EDT) Sirohi, Rajpal S. Sirohi, R. S. Sirohi, R.S. Sirohi
Publisher: Taylor & Francis Inc
No Review Yet
₹42,375
₹25,001
Binding:
Hardback
Release:
20 May 1993
Language:
English
Available
Ships within 12-14 Days Explain..
4.
Optical Methods of Measurement41 %
Optical Methods of Measurement
By: Au, Rajpal S. Sirohi, RAJPAL SIROHI, Rajpal S Sirohi, Rajpal (Austin, Texas, USA) Sirohi
Publisher: CRC Press
No Review Yet
₹8,700
₹5,133
Binding:
Paperback
Release:
16 Jun 2017
Language:
English
Available
Ships within 12-14 Days Explain..
5.
Optical Methods of Measurement32 %
Optical Methods of Measurement
By: Rajpal S. Sirohi, RAJPAL SIROHI, Rajpal S Sirohi, Rajpal (Austin, Texas, USA) Sirohi
Publisher: CRC Press
No Review Yet
₹23,760
₹16,157
Binding:
Hardback
Release:
01 Jun 2009
Language:
English
Out of Stock
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6.
Selected Papers on Electronic Speckle Pattern Interferometry42 %
Selected Papers on Electronic Speckle Pattern Interferometry
By: Rajpal S. Sirohi, Peter Meinlschmidt, Klaus D. Hinsch
Publisher: Spie Press
No Review Yet
₹12,769
₹7,406
Binding:
Paperback
Release:
30 Dec 1996
Out of Stock
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7.
Introduction to Optical MetrologyNR
Introduction to Optical Metrology
By: Rajpal (Austin, Texas, USA) Sirohi, Rajpal S. (Austin, Texas, USA) Sirohi
Publisher: Taylor & Francis Ltd
No Review Yet
₹13,901
Binding:
Hardback
Release:
18 Aug 2025
Out of Stock
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8.
Selected Papers on Electric Speckle Pattern interferometryNR
Selected Papers on Electric Speckle Pattern interferometry
By: Peter Meinlschmidt (Editor), Klaus D. Hinsch (Editor), Rajpal S. Sirohi (Editor), Peter Meinlschmidt (Carl von Ossietzky University Germany), Klaus D. Hinsch (Carl von Ossietzky University Old Germany)
Publisher: Spie Press
No Review Yet
₹9,885
Binding:
Hardcover
Release:
31 Dec 1996
Language:
English
Out of Stock
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