Rajeshuni Ramesham

Rajeshuni Ramesham

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Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices VIII2 % NR
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Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS, Nanodevices, and Nanomaterials XIIINR
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Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS IVNR
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4.
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VNR
Publisher: Spie Press
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₹10,761
Binding:
Paperback
Release:
01 Jan 2006
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5.
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VIINR
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