Pougnet, Philippe

Pougnet, Philippe

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4.
Applications et metrologie a l'echelle nanometrique 1: materiaux intelligents, onde electromagnetique et incertitudesNR
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5.
Applications et metrologie a l'echelle nanometrique 2: systemes de mesure, ingenierie quantique et methodes d'optimisation fiabilisteNR
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9.
Les systemes mecatroniques embarques 1: Analyse des causes de defaillances, fiabilite et contraintes - 2e edition revue et augmenteeNR
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10.
Les systemes mecatroniques embarques 2: Analyse des causes de defaillances, modelisation, simulation et optimisation - 2e edition revue et augmenteeNR
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12.
Defauts a l'echelle nanometrique en lumiere polarisee
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₹247
Binding:
Paperback
Release:
7/31/2016
Language:
French
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