Peter Z. Takacs

Peter Z. Takacs

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1.
Advances in Metrology for X-ray and EUV Optics IINR
Publisher: Spie Press
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₹10,635
Binding:
Paperback
Release:
13 Sep 2007
Language:
English
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2.
Advances in Metrology for X-ray and EUV OpticsNR
Publisher: Spie Press
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₹10,708
Binding:
Paperback
Release:
15 Aug 2005
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