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Paul S. (IBM T J Watson Research Center, New York) Ho

Paul S. (IBM T J Watson Research Center, New York) Ho

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Materials Reliability Issues in Microelectronics: Volume 225NR
Materials Reliability Issues in Microelectronics: Volume 225
By: James R. Lloyd, Paul S. (IBM T J Watson Research Center, New York) Ho, Frederick G. Yost, James R Lloyd, Paul S Ho
Publisher: Cambridge University Press
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₹2,664
Binding:
Hardback
Release:
22 Oct 1991
Language:
English
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