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P S Ho

P S Ho

15 results found
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1.
Clearing the Air59 %
Clearing the Air
By: Mun S Ho, Chris P Nielsen, Mun S. (Visiting Scholar, Harvard University) Ho, Chris P. (Executive Director, Harvard University School of Engineering and Applied Sciences) Nielsen
Publisher: Mit Press
No Review Yet
₹5,142
₹2,108
Binding:
Hardback
Release:
23 Mar 2007
Language:
English
Available
Ships within 1-2 Days Explain..
2.
Clearer Skies Over China22 %
Clearer Skies Over China
By: Chris P. Nielsen, Mun S Ho, Chris P Nielsen, Jing Cao, Yu Zhao
Publisher: Mit Press
No Review Yet
₹5,232
₹4,081
Binding:
Hardback
Release:
18 Oct 2013
Language:
English
Available
Ships within 4-6 Days Explain..
3.
Wave And Stability In Fluids27 %
Wave And Stability In Fluids
By: D.Y. Hsieh, S.P. Ho, S. P. Ho
Publisher: World Scientific Publishing Co Pte Ltd
No Review Yet
₹7,487
₹5,466
Binding:
Hardback
Release:
12 Jan 1994
Available
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4.
Low Dielectric Constant Materials for IC Applications37 %
Low Dielectric Constant Materials for IC Applications
By: W. W. Lee, P. S. Ho, Paul S. Ho, Wei William Lee, Jihperng Leu
Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
No Review Yet
₹14,400
₹9,072
Binding:
Hardback
Release:
14 Nov 2002
Language:
English
Available
Ships within 12-14 Days Explain..
5.
Thin Films -- Interfaces and Phenomena: Volume 5438 %
Thin Films -- Interfaces and Phenomena: Volume 54
By: R J Nemanich, P S Ho, S S Lau
Publisher: Cambridge University Press
No Review Yet
₹3,698
₹2,293
Binding:
Hardback
Release:
15 Apr 1986
Language:
English
Available
Ships within 2-4 Days Explain..
6.
Stress-Induced Phenomena in Metallization
Stress-Induced Phenomena in Metallization
By: Eduard Arzt, Paul S Ho, Shefford P Baker, Matti A Korhonen
Publisher: American Institute of Physics
No Review Yet
₹1,327
Binding:
Hardback
Release:
09 Apr 2002
Language:
English
Available
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7.
Materials Reliability in Microelectronics III: Volume 30937 %
Materials Reliability in Microelectronics III: Volume 309
By: William F. Filter, Paul S. (University of Texas, Austin) Ho, Harold J. (Dartmouth College, New Hampshire) Frost, Harold J Frost, Kenneth P Rodbell
Publisher: Cambridge University Press
No Review Yet
₹2,886
₹1,818
Binding:
Hardback
Release:
31 Aug 1993
Language:
English
Available
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8.
Stress-Induced Phenomena in Metallization
Stress-Induced Phenomena in Metallization
By: Ehrenfried Zschech, Shinichi Ogawa, P S Ho
Publisher: American Institute of Physics
No Review Yet
₹1,712
Binding:
Hardback
Release:
13 Nov 2007
Language:
English
Available
Ships within 4-6 Days Explain..
9.
Materials Reliability in Microelectronics III: Volume 30913 % POD/NR
Materials Reliability in Microelectronics III: Volume 309
By: William F. Filter, Paul S. (University of Texas, Austin) Ho, Harold J. (Dartmouth College, New Hampshire) Frost, Harold J Frost, Kenneth P Rodbell
Publisher: Cambridge University Press
No Review Yet
₹3,080
₹2,680
Binding:
Paperback
Release:
05 Jun 2014
Language:
English
International Edition
Ships within 12-14 Days Explain..
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Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
10.
Stress-Induced Phenomena in Metallization12 %
Stress-Induced Phenomena in Metallization
By: No, C y Li, P S Ho, P Totta, no
Publisher: American Institute of Physics
No Review Yet
₹7,682
₹6,760
Binding:
Hardback
Release:
27 Mar 1998
Language:
English
Out of Stock
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11.
Thin Films Interfaces and Phenomena: Volume 542 % NR
Thin Films Interfaces and Phenomena: Volume 54
By: P. S. Ho, R. J. Nemanich, S. S. Lau
Publisher: Cambridge University Press
No Review Yet
₹2,732
₹2,684
Binding:
Paperback
Release:
05 Jun 2014
Language:
English
Out of Stock
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12.
Topics in Pathology for Hong Kong26 % NR
Topics in Pathology for Hong Kong
By: Faith C S Ho, P C Wu
Publisher: Hong Kong University Press
No Review Yet
₹1,760
₹1,302
Binding:
Paperback
Release:
01 Aug 1995
Language:
English
Out of Stock
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13.
Stress Induced Phenomena in MetallizationNR
Stress Induced Phenomena in Metallization
By: Hidekazu Okabayashi, P S Ho, H Okabayashi, S Shingubara
Publisher: American Institute of Physics
No Review Yet
₹11,902
Binding:
Hardback
Release:
01 Oct 1998
Language:
English
Out of Stock
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14.
Stress-Induced Phenomena in MetallizationNR
Stress-Induced Phenomena in Metallization
By: Ehrenfried Zschech, Shinichi Ogawa, P S Ho
Publisher: American Institute of Physics
No Review Yet
₹13,076
Binding:
Hardback
Release:
20 Dec 2010
Language:
English
Out of Stock
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15.
Stress-Induced Phenomena in MetallizationNR
Stress-Induced Phenomena in Metallization
By: Tomoji Nakamura, Cynthia A Volkert, Paul S Ho, Shefford P Baker
Publisher: American Institute of Physics
No Review Yet
₹11,956
Binding:
Hardback
Release:
01 Dec 2004
Language:
English
Out of Stock
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