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Nur Touba

Nur Touba

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1.
VLSI Test Principles and Architectures13 % NR
VLSI Test Principles and Architectures
By: Charles Stroud, Benoit Nadeau-Dostie, Abhijit Chatterjee, Laung-Terng Wang, Nur Touba
Publisher: Morgan Kaufmann Publishers
No Review Yet
₹7,556
₹6,574
Binding:
Hardback
Release:
01 Jun 2006
Language:
English
International Edition
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Free Shipping in India and low cost Worldwide.
2.
System-On-Chip Test Architectures5 % NR
System-On-Chip Test Architectures
By: Laung-Terng Wang, Charles E. Stroud, Nur Touba, Charles E Stroud, Nur A Touba
Publisher: Morgan Kaufmann Publishers
No Review Yet
₹5,604
₹5,312
Binding:
Hardback
Release:
01 Nov 2007
Language:
English
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