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Newbury Dale E. Newbury

Newbury Dale E. Newbury

14 results found
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1.
Scanning Electron Microscopy and X-Ray Microanalysis37 %
Scanning Electron Microscopy and X-Ray Microanalysis
By: Dale E. Newbury, Charles E. Lyman, Linda Sawyer, Joseph Goldstein, Patrick Echlin
Publisher: Springer
No Review Yet
₹10,560
₹6,653
Binding:
Hardback
Release:
30 Apr 2007
Language:
English
Available
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2.
Scanning Electron Microscopy and X-Ray Microanalysis37 %
Scanning Electron Microscopy and X-Ray Microanalysis
By: Dale E. Newbury, Charles E. Lyman, Linda Sawyer, Joseph Goldstein, Patrick Echlin
Publisher: Springer
4.7 (6)
₹10,560
₹6,653
Binding:
Paperback
Release:
31 May 2013
Language:
English
Available
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3.
Scanning Electron Microscopy and X-Ray Microanalysis43 %
Scanning Electron Microscopy and X-Ray Microanalysis
By: Dale E. Newbury, John Henry Scott, Joseph R. Michael, Joseph Goldstein, Joseph I. Goldstein
Publisher: Springer
5.0 (1)
₹10,460
₹5,962
Binding:
Hardback
Release:
18 Nov 2017
Language:
English
Available
Ships within 2-4 Days Explain..
4.
Scanning Electron Microscopy and X-Ray Microanalysis38 %
Scanning Electron Microscopy and X-Ray Microanalysis
By: Dale E. Newbury, Joseph R. Michael, Joseph I. Goldstein, David C. Joy, David C Joy
Publisher: Springer New York
No Review Yet
₹9,510
₹5,896
Binding:
Paperback
Release:
30 Aug 2018
Language:
English
Available
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5.
Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy37 %
Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy
By: Dale E. Newbury, Charles E. Lyman, Alton D., Jr. Romig, David B Williams, Alton D. Romig Jr.
Publisher: Springer
No Review Yet
₹9,600
₹6,048
Binding:
Hardback
Release:
31 Aug 1990
Language:
English
Available
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6.
Advanced Scanning Electron Microscopy and X-Ray Microanalysis21 %
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
By: Dale E. Newbury, Joseph Goldstein, Patrick Echlin, David C. Joy, C.E. Fiori
Publisher: Springer
No Review Yet
₹9,600
₹7,584
Binding:
Paperback
Release:
08 Jun 2013
Language:
English
Available
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7.
Advanced Scanning Electron Microscopy and X-Ray Microanalysis43 %
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
By: Dale E. Newbury, Joseph Goldstein, D. C. Joy, Patrick Echlin, David C. Joy
Publisher: Springer
No Review Yet
₹8,079
₹4,605
Binding:
Hardback
Release:
31 Mar 1986
Language:
English
Available
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8.
Scanning Electron Microscopy and X-Ray Microanalysis37 %
Scanning Electron Microscopy and X-Ray Microanalysis
By: Dale E. Newbury, Charles Fiori, Joseph Goldstein, Patrick Echlin, David C. Joy
Publisher: Springer
No Review Yet
₹9,600
₹6,048
Binding:
Paperback
Release:
20 Mar 2013
Language:
English
Available
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9.
X-Ray Spectrometry in Electron Beam Instruments37 %
X-Ray Spectrometry in Electron Beam Instruments
By: Dale E. Newbury, David B Williams, Joseph Goldstein, Joseph I. Goldstein, David B. Williams
Publisher: Springer
No Review Yet
₹19,200
₹12,096
Binding:
Paperback
Release:
21 Oct 2012
Language:
English
Available
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10.
X-Ray Spectrometry in Electron Beam Instruments37 %
X-Ray Spectrometry in Electron Beam Instruments
By: David B Williams, Joseph Goldstein, Dale E Newbury
Publisher: Springer
No Review Yet
₹19,200
₹12,096
Binding:
Hardback
Release:
31 Mar 1995
Language:
English
Available
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11.
Scanning Electron Microscopy and X-Ray MicroanalysisNR
Scanning Electron Microscopy and X-Ray Microanalysis
By: Echlin Patrick Echlin, Goldstein Joseph Goldstein, Newbury Dale E. Newbury
Publisher: Springer Nature B.V.
No Review Yet
₹4,430
Binding:
Paperback
Release:
02 Jun 2013
Language:
English
International Edition
Ships within 14-16 Days Explain..
Free Shipping in India and low cost Worldwide.
12.
Scanning Electron Microscopy and X-Ray MicroanalysisNR
Scanning Electron Microscopy and X-Ray Microanalysis
By: Newbury Dale E. Newbury, Goldstein Joseph I. Goldstein, Michael Joseph R. Michael
Publisher: Springer Nature B.V.
No Review Yet
₹4,323
Binding:
Paperback
Release:
18 Nov 2017
Language:
English
Out of Stock
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13.
Scanning Microscopies 2012NR
Scanning Microscopies 2012
By: Dale E. (National Institute of Standards and Techn, Michael T. Postek, S. Frank Platek, Dale E. (National Institute of Standards and Technology, Gaithersburg, MD, USA) Newbury
Publisher: Spie Press
No Review Yet
₹9,110
Binding:
Paperback
Release:
15 Jul 2012
Out of Stock
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14.
Scanning Electron Microscopy and X-Ray MicroanalysisNR
Scanning Electron Microscopy and X-Ray Microanalysis
By: Goldstein Joseph Goldstein, Newbury Dale E. Newbury, Joy David C. Joy
Publisher: Springer Nature B.V.
No Review Yet
₹4,318
Binding:
Paperback
Release:
01 Sep 2011
Language:
English
Out of Stock
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