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National Institute of Standards

National Institute of Standards

277 results found
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1.
Advanced Topics in Forensic DNA Typing: Methodology12 % NR
Advanced Topics in Forensic DNA Typing: Methodology
By: John M Butler, John M., Ph.D. (Analytical Chemistry), University of Virginia (National Institute of Standards and Technology (NIST), Gaithersburg, MD, USA) Butler
Publisher: Academic Press
4.1 (7)
₹9,240
₹8,131
Binding:
Hardback
Release:
21 Jul 2011
Language:
English
International Edition
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2.
Advanced Topics in Forensic DNA Typing: Interpretation12 % NR
Advanced Topics in Forensic DNA Typing: Interpretation
By: John M. Butler, John M Butler, John M., Ph.D. (Analytical Chemistry), University of Virginia (National Institute of Standards and Technology (NIST), Gaithersburg, MD, USA) Butler
Publisher: Academic Press
No Review Yet
₹8,796
₹7,740
Binding:
Hardback
Release:
08 Oct 2014
Language:
English
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3.
Fundamentals of Forensic DNA Typing
Fundamentals of Forensic DNA Typing
By: John M. Butler, John M Butler, John M. (National Institute of Standards and Technology, Gaithersburg, Maryland, USA) Butler, John M. (NIST Fellow and Special Assistant to the Director for Forensic Science, Office of Special Programs, at the U.S. National Institute of Standards and Technology, in Gaithersburg, Maryland.) Butler
Publisher: Elsevier Science Publishing Co Inc
No Review Yet
₹2,681
Binding:
Paperback
Release:
20 Aug 2009
Language:
English
Available
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4.
Indentation Fracture18 % NR
Indentation Fracture
By: Robert F Cook, Robert F. (National Institute of Standards and Technology (NIST), MD, USA) Cook
Publisher: Wiley
No Review Yet
₹15,400
₹12,628
Binding:
Hardback
Release:
11 Mar 2025
Language:
English
International Edition
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5.
Introduction to Privacy Engineering and Risk Management in Federal Systems7 % POD/NR
Introduction to Privacy Engineering and Risk Management in Federal Systems
By: National Institute of Standards and Technology (Corporate Author), National Institute of Standards
Publisher: Createspace Independent Publishing Platform
No Review Yet
₹1,415
₹1,316
Binding:
Paperback
Release:
31 Jan 2017
Language:
English
International Edition
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Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
6.
Land Restoration19 % NR
Land Restoration
By: Martin Frick, Ilan Chabay, Jennifer Helgeson, Ilan (Institute of Advanced Sustainability Studies, Potsdam, Germany) Chabay, Jennifer (Applied Economics Office of the National Institute of Standards and Technology (NIST)) Helgeson
Publisher: Academic Press
No Review Yet
₹10,560
₹8,554
Binding:
Hardback
Release:
28 Oct 2015
Language:
English
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7.
Mutation, Randomness, and Evolution
Mutation, Randomness, and Evolution
By: Arlin Stoltzfus, Stoltzfus, Dr Arlin (Research Biologist, Research Biologist, National Institute of Standards and Technology, Gaithersburg, Maryland, USA) Stoltzfus
Publisher: Oxford University Press
No Review Yet
₹2,907
Binding:
Paperback
Release:
25 May 2023
Language:
English
Available
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8.
CRC Handbook of Basic Tables for Chemical Analysis
CRC Handbook of Basic Tables for Chemical Analysis
By: Paris D.N. Svoronos, Thomas J. Bruno, Thomas J Bruno, Thomas J. (National Institute of Standards and Technology, Boulder, Colorado, USA) Bruno, Paris D N Svoronos
Publisher: Taylor & Francis Ltd
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₹4,731
Binding:
Paperback
Release:
01 Aug 2022
Language:
English
Available
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9.
CRC Handbook of Basic Tables for Chemical Analysis
CRC Handbook of Basic Tables for Chemical Analysis
By: Paris D.N. Svoronos, Thomas J. Bruno, Thomas J Bruno, Thomas J. (National Institute of Standards and Technology, Boulder, Colorado, USA) Bruno, Paris D N Svoronos
Publisher: Taylor and Francis
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₹11,240
Binding:
Hardback
Release:
31 Jul 2020
Language:
English
Available
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10.
Coexistence in Wireless Networks38 %
Coexistence in Wireless Networks
By: Nada Golmie, Nada (National Institute of Standards and Technology, Maryland) Golmie
Publisher: Cambridge University Press
No Review Yet
₹8,571
₹5,314
Binding:
Hardback
Release:
01 Sep 2006
Language:
English
Available
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11.
From the Outer Heliosphere to the Local Bubble37 %
From the Outer Heliosphere to the Local Bubble
By: J. L. Linsky, E. Mobius, V. V. Izmodenov, Rudolf von Steiger, Jeffrey L. (National Institute of Standards and Te Linsky
Publisher: Springer-Verlag New York Inc.
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₹13,950
₹8,789
Binding:
Paperback
Release:
25 Nov 2014
Language:
English
Available
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12.
Applications of Scanned Probe Microscopy to Polymers
Applications of Scanned Probe Microscopy to Polymers
By: Gilbert C Walker, James D Batteas, Chris A. (Research Chemist, National Institute of Standards and Technology) Michaels, Gilbert C. (Professor of Chemistry, University of Pittsburgh) Walker, James D. (Research Chemist, National Institute of Standards and Technology) Batteas
Publisher: American Chemical Society
No Review Yet
₹9,885
Binding:
Hardback
Release:
01 Feb 2005
Language:
English
Available
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13.
Human Stress and the Environment35 %
Human Stress and the Environment
By: J Rose, Allen H. Rose, J. Rose , Allen H Rose, Allen H. (National Institute of Standards & Technology, Colorado, USA) Rose
Publisher: CRC Press
No Review Yet
₹44,000
₹28,600
Binding:
Hardback
Release:
23 Sep 1994
Language:
English
Available
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14.
Micro-Economics37 %
Micro-Economics
By: A Thomas, C. Abraham, D. V. Jones, C Abraham, A. (All of the National Institute for Biological Standards and Control, Potters Bar) Thomas
Publisher: Springer
No Review Yet
₹4,650
₹2,930
Binding:
Paperback
Release:
13 Jul 2013
Language:
English
Available
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15.
CRC Handbook of Fundamental Spectroscopic Correlation Charts
CRC Handbook of Fundamental Spectroscopic Correlation Charts
By: Paris D.N. Svoronos, Thomas J. Bruno, Paris D. N. Svoronos, Thomas J. (National Institute of Standards and Technology, Boulder, Colorado, USA) Bruno, Paris D.N. (City University of New York, Bayside, USA) Svoronos
Publisher: Taylor & Francis Inc
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₹5,151
Binding:
Paperback
Release:
31 Oct 2005
Language:
English
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16.
Metrology and Diagnostic Techniques for Nanoelectronics33 % NR
Metrology and Diagnostic Techniques for Nanoelectronics
By: David G. Seiler, Zhiyong Ma, David G Seiler, David G. (National Institute of Standards and Technology, Hillsboro, OR, USA) Seiler, Zhiyong (Intel Corporation, Hillsboro, OR, USA) Ma
Publisher: Pan Stanford Publishing
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₹37,286
₹24,982
Binding:
Hardback
Release:
03 Oct 2016
Language:
English
Available
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17.
A Century of Excellence in Measurements, Standards, and Technology41 %
A Century of Excellence in Measurements, Standards, and Technology
By: David R. Lide, David R Lide, David R. (National Institute of Standards & Technology (Retired), Gaithersburg, Maryland, USA) Lide
Publisher: CRC Press
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₹17,205
₹10,151
Binding:
Hardback
Release:
16 Apr 2018
Language:
English
Available
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18.
Radio Frequency Identification Engineering9 % NR
Radio Frequency Identification Engineering
By: Nuno Borges (Universidade de Aveiro, Portugal) Carvalho, Alirio (National Institute of Standards and Technology, Colorado) Soares Boaventura, Alirio (University of Aveiro, Portugal) Soares Boaventura, Nuno Borges (University of Aveiro, Portugal) Carvalho
Publisher: Cambridge University Press
No Review Yet
₹10,560
₹9,610
Binding:
Hardback
Release:
31 Oct 2024
International Edition
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19.
Honoring Charlotte Moore Sitterly (Iau S371)11 % NR
Honoring Charlotte Moore Sitterly (Iau S371)
By: David R Soderblom, David R. (Space Telescope Science Institute, USA) Soderblom, Gillian (National Institute of Standards and Technology, Maryland) Nave, Gillian Nave
Publisher: Cambridge University Press
No Review Yet
₹12,760
₹11,356
Binding:
Hardback
Release:
29 Feb 2024
Language:
English
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20.
Particle Strengths30 % NR
Particle Strengths
By: Cook, RF Cook, Robert F Cook, Robert F. (National Institute of Standards and Technology (NIST), MD, USA) Cook
Publisher: John Wiley & Sons Inc
No Review Yet
₹18,920
₹13,244
Binding:
Hardback
Release:
16 Aug 2023
Language:
English
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