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Mario Birkholz

Mario Birkholz

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1.
Thin Film Analysis by X-Ray Scattering4 % NR
Thin Film Analysis by X-Ray Scattering
By: Mario Birkholz
Publisher: Wiley
No Review Yet
₹17,024
₹16,410
Binding:
Online resource
Release:
15 May 2006
Language:
English
Out of Stock
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2.
Thin Film Analysis by X-Ray Scattering21 % NR
Thin Film Analysis by X-Ray Scattering
By: Christoph Genzel, Mario Birkholz, M Birkholz, Mario (IHP Microelectronics, Frankfurt/Oder, Germany) Birkholz
Publisher: Wiley-VCH Verlag GmbH
No Review Yet
₹16,319
₹12,892
Binding:
Hardback
Release:
15 Nov 2005
Language:
English
Out of Stock
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