Manoj Sachdev

Manoj Sachdev

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2.
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits37 %
Publisher: Springer
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₹19,200
₹12,096
Binding:
Paperback
Release:
10 Nov 2010
Language:
English
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3.
Esd Protection Device and Circuit Design for Advanced CMOS Technologies37 %
Publisher: Springer
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₹16,320
₹10,282
Binding:
Hardback
Release:
06 May 2008
Language:
English
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4.
Esd Protection Device and Circuit Design for Advanced CMOS Technologies37 %
Publisher: Springer
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₹16,320
₹10,282
Binding:
Paperback
Release:
19 Oct 2010
Language:
English
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5.
Thermal and Power Management of Integrated Circuits37 %
Publisher: Springer
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₹9,600
₹6,048
Binding:
Paperback
Release:
29 Nov 2010
Language:
English
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6.
CMOS Sram Circuit Design and Parametric Test in Nano-Scaled Technologies37 %
Publisher: Springer
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₹15,360
₹9,677
Binding:
Paperback
Release:
28 Oct 2010
Language:
English
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