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M Oder

M Oder

5 results found
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1.
Betriebskosten Der Verschiebebahnhöfe36 %
Betriebskosten Der Verschiebebahnhöfe
By: M. Oder, M Oder
Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
No Review Yet
₹4,668
₹2,988
Binding:
Paperback
Release:
01 Jan 1905
Language:
German
Available
Ships within 12-14 Days Explain..
2.
Modellierung, Simulation Und Optimierung Von Nachrichtensystemen36 %
Modellierung, Simulation Und Optimierung Von Nachrichtensystemen
By: Ga1/4nter Sader, G. S'Oder, Gunter Sader, G. Nter S. Der, Günter Söder
Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
No Review Yet
₹5,139
₹3,289
Binding:
Paperback
Release:
19 Nov 1993
Language:
German
Available
Ships within 12-14 Days Explain..
3.
Techniques and Challenges for 300 mm Silicon: Processing, Characterization, Modelling and Equipment
Techniques and Challenges for 300 mm Silicon: Processing, Characterization, Modelling and Equipment
By: H. (Institute for Semiconductor Physics, Franfurt Richter, P. (Wacker Siltronic AG, Burghausen, Germany) Wagner, G. (SEMITOOL Inc, Kalispell, USA) Ritter, H. (Institute for Semiconductor Physics, Franfurt (Oder), Germany) Richter
Publisher: Elsevier Science & Technology
No Review Yet
₹4,285
Binding:
Hardback
Release:
01 Sep 1999
Available
Ships within 4-6 Days Explain..
4.
Fundraising Analytics13 % POD/NR
Fundraising Analytics
By: Joshua M. Birkholz, Birkholz, Joshua M Birkholz, JM Birkholz, Joshua M. (IHP Microelectronics, Frankfurt/Oder, Germany) Birkholz
Publisher: Wiley
No Review Yet
₹6,463
₹5,623
Binding:
Hardback
Release:
01 Apr 2008
Language:
English
International Edition
Ships within 12-14 Days Explain..
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Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
5.
Thin Film Analysis by X-Ray Scattering19 % NR
Thin Film Analysis by X-Ray Scattering
By: Christoph Genzel, Mario Birkholz, M Birkholz, Mario (IHP Microelectronics, Frankfurt/Oder, Germany) Birkholz
Publisher: Wiley-VCH Verlag GmbH
No Review Yet
₹16,935
₹13,717
Binding:
Hardback
Release:
15 Nov 2005
Language:
English
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