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Lucian (Siemens Healthcare Diagnostics (Retired)) Kasprzak

Lucian (Siemens Healthcare Diagnostics (Retired)) Kasprzak

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Reliability and Failure of Electronic Materials and DevicesPOD/NR
Reliability and Failure of Electronic Materials and Devices
By: Lucian Kasprzak, Milton Ohring, James R Lloyd, Milton (Stevens Institute of Technology, Hoboken, NJ, USA (Retired)) Ohring, Lucian (Siemens Healthcare Diagnostics (Retired)) Kasprzak
Publisher: Academic Press
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₹13,640
Binding:
Hardback
Release:
01 Dec 2014
Language:
English
International Edition
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