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1.
VLSI Test Principles and Architectures17 % NR
VLSI Test Principles and Architectures
By: Charles Stroud, Benoit Nadeau-Dostie, Abhijit Chatterjee, Laung-Terng Wang, Nur Touba
Publisher: Morgan Kaufmann Publishers
No Review Yet
₹7,646
₹6,346
Binding:
Hardback
Release:
01 Jun 2006
Language:
English
International Edition
Ships within 18-20 Days Explain..
Free Shipping in India and low cost Worldwide.
2.
System-On-Chip Test Architectures17 % NR
System-On-Chip Test Architectures
By: Laung-Terng Wang, Charles E. Stroud, Nur Touba, Charles E Stroud, Nur A Touba
Publisher: Morgan Kaufmann Publishers
No Review Yet
₹7,221
₹5,993
Binding:
Hardback
Release:
01 Nov 2007
Language:
English
International Edition
Ships within 18-20 Days Explain..
Free Shipping in India and low cost Worldwide.
3.
Electronic Design Automation16 % NR
Electronic Design Automation
By: Kwang-Ting Cheng, Laung-Terng Wang, Yao-Wen Chang, Cheng, Kwang-Ting (Tim) Cheng
Publisher: Morgan Kaufmann Publishers
No Review Yet
₹9,350
₹7,854
Binding:
Hardback
Release:
01 Feb 2009
Language:
English
International Edition
Ships within 18-20 Days Explain..
Free Shipping in India and low cost Worldwide.
4.
VLSI Test Principles and ArchitecturesNR
VLSI Test Principles and Architectures
By: Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen, Laung-Terng Wang (Editor), Cheng-Wen Wu (Series Editor)
Publisher: Morgan Kaufmann
No Review Yet
₹7,688
Binding:
Paperback
Release:
21 Jul 2006
Language:
English
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