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17 % NR

VLSI Test Principles and Architectures

By: Charles Stroud, Benoit Nadeau-Dostie, Abhijit Chatterjee, Laung-Terng Wang, Nur Touba

Publisher: Morgan Kaufmann Publishers

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₹7,646

₹6,346

Binding:	Hardback
Release:	01 Jun 2006
Language:	English

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17 % NR

System-On-Chip Test Architectures

By: Laung-Terng Wang, Charles E. Stroud, Nur Touba, Charles E Stroud, Nur A Touba

Publisher: Morgan Kaufmann Publishers

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₹7,221

₹5,993

Binding:	Hardback
Release:	01 Nov 2007
Language:	English

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16 % NR

Electronic Design Automation

By: Kwang-Ting Cheng, Laung-Terng Wang, Yao-Wen Chang, Cheng, Kwang-Ting (Tim) Cheng

Publisher: Morgan Kaufmann Publishers

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₹9,350

₹7,854

Binding:	Hardback
Release:	01 Feb 2009
Language:	English

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VLSI Test Principles and Architectures

By: Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen, Laung-Terng Wang (Editor), Cheng-Wen Wu (Series Editor)

Publisher: Morgan Kaufmann

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₹7,688

Binding:	Paperback
Release:	21 Jul 2006
Language:	English

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