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Kenneth C. (APM Product Manager, GE Digital, Roanoke, VA) Latino

Kenneth C. (APM Product Manager, GE Digital, Roanoke, VA) Latino

3 results found
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1.
Root Cause Analysis43 %
Root Cause Analysis
By: Robert J Latino, Mark a Latino, Robert J. (Reliability Center, Inc., Hopewell, Virginia, USA) Latino, Kenneth C Latino, Kenneth C. (APM Product Manager, GE Digital, Roanoke, VA) Latino
Publisher: Taylor and Francis
No Review Yet
₹4,787
₹2,729
Binding:
Paperback
Release:
02 Apr 2021
Language:
English
Available
Ships within 1-2 Days Explain..
2.
PROACT(R) Root Cause Analysis47 %
PROACT(R) Root Cause Analysis
By: Robert J Latino, Mark a Latino, Kenneth C Latino, Robert J. (CEO, Reliability Center, Inc., Hopewell, VA) Latino, Kenneth C. (APM Product Manager, GE Digital, Roanoke, VA) Latino
Publisher: Taylor and Francis
No Review Yet
₹5,882
₹3,117
Binding:
Hardback
Release:
11 Sep 2020
Language:
English
Available
Ships within 12-14 Days Explain..
3.
Proact(r) Root Cause AnalysisNR
Proact(r) Root Cause Analysis
By: Robert J Latino, Mark a Latino, Kenneth C Latino, Kenneth C. (APM Product Manager, GE Digital, Roanoke, VA) Latino, Mark A. (President, Reliability Center, Inc., Hopewell, VA) Latino
Publisher: CRC Press
No Review Yet
₹2,315
Binding:
Paperback
Release:
07 Oct 2024
Language:
English
International Edition
Ships within 18-20 Days Explain..
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