Humburger Icon
Logo1
Login & Sign up
Bookswagon-24x7 online bookstore
AddBanner
Home icon Home
Account Icon Account
Wishlist Icon Wishlist
Cart Icon Cart
Bookswagon icon Categories
Close

Refine your Search

By Price

Availability

Shipping Time

Source

Binding

Language

Publication Year

Filter By Category
Kenneth C. (APM Product Manager, GE Digital, Roanoke, VA) Latino

Kenneth C. (APM Product Manager, GE Digital, Roanoke, VA) Latino

3 results found
List viewGrid view
Sort By:
1.
Root Cause Analysis43 %
Root Cause Analysis
By: Robert J Latino, Mark a Latino, Robert J. (Reliability Center, Inc., Hopewell, Virginia, USA) Latino, Kenneth C Latino, Kenneth C. (APM Product Manager, GE Digital, Roanoke, VA) Latino
Publisher: Taylor and Francis
No Review Yet
₹4,787
₹2,729
Binding:
Paperback
Release:
02 Apr 2021
Language:
English
Available
Ships within 1-2 Days Explain..
2.
PROACT(R) Root Cause Analysis47 %
PROACT(R) Root Cause Analysis
By: Robert J Latino, Mark a Latino, Kenneth C Latino, Robert J. (CEO, Reliability Center, Inc., Hopewell, VA) Latino, Kenneth C. (APM Product Manager, GE Digital, Roanoke, VA) Latino
Publisher: Taylor and Francis
No Review Yet
₹5,882
₹3,117
Binding:
Hardback
Release:
11 Sep 2020
Language:
English
Available
Ships within 12-14 Days Explain..
3.
The PROACT® Root Cause Analysis8 % NR
The PROACT® Root Cause Analysis
By: Robert J Latino, Mark a Latino, Kenneth C Latino, Kenneth C. (APM Product Manager, GE Digital, Roanoke, VA) Latino, Mark A. (President, Reliability Center, Inc., Hopewell, VA) Latino
Publisher: CRC Press
No Review Yet
₹2,295
₹2,111
Binding:
Paperback
Release:
07 Oct 2024
Language:
English
International Edition
Ships within 18-20 Days Explain..
Free Shipping in India and low cost Worldwide.
No more records found