Humburger Icon
Logo1
Login & Sign up
Bookswagon-24x7 online bookstore
AddBanner
Home icon Home
Account Icon Account
Wishlist Icon Wishlist
Cart Icon Cart
Bookswagon icon Categories
Close

Refine your Search

By Price

Availability

Shipping Time

Source

Binding

Language

Publication Year

Filter By Category
K Diebold

K Diebold

13 results found
List viewGrid view
Sort By:
1.
Pigments, Extenders, and Particles in Surface Coatings and Plastics37 %
Pigments, Extenders, and Particles in Surface Coatings and Plastics
By: Brett R Hester, Frank A C Vanhecke, Michael Diebold, Philipp M Niedenzu, Steven de Backer
Publisher: Springer International Publishing
No Review Yet
₹11,040
₹6,955
Binding:
Paperback
Release:
20 Nov 2023
Language:
English
Available
Ships within 12-14 Days Explain..
2.
Pigments, Extenders, and Particles in Surface Coatings and Plastics37 %
Pigments, Extenders, and Particles in Surface Coatings and Plastics
By: Brett R Hester, Frank A C Vanhecke, Michael Diebold, Philipp M Niedenzu, Steven de Backer
Publisher: Springer International Publishing
No Review Yet
₹15,360
₹9,677
Binding:
Hardback
Release:
06 Nov 2022
Language:
English
Available
Ships within 12-14 Days Explain..
3.
Die Erblichen Myoklonisch-Epileptisch-Dementiellen Kernsyndrome21 %
Die Erblichen Myoklonisch-Epileptisch-Dementiellen Kernsyndrome
By: K. Diebold, K Diebold
Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
No Review Yet
₹4,934
₹3,898
Binding:
Paperback
Release:
07 Jan 2012
Language:
German
Available
Ships within 12-14 Days Explain..
4.
Histopathology of Nodal and Extranodal Non-Hodgkin's Lymphomas21 %
Histopathology of Nodal and Extranodal Non-Hodgkin's Lymphomas
By: M. C. Paulli, Alfred C. Feller, Jacques Diebold, Alfred C Feller, A Le Tourneau
Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
No Review Yet
₹10,560
₹8,342
Binding:
Paperback
Release:
19 Aug 2012
Language:
English
Available
Ships within 12-14 Days Explain..
5.
Frontiers of Characterization and Metrology for Nanoelectronics
Frontiers of Characterization and Metrology for Nanoelectronics
By: Robert McDonald, David G Seiler, Alain C Diebold, C Michael Garner, Dan Herr
Publisher: American Institute of Physics
No Review Yet
₹5,474
Binding:
SF
Release:
26 Oct 2009
Language:
English
Available
Ships within 4-6 Days Explain..
6.
Histopathology of Nodal and Extranodal Non-Hodgkin's Lymphomas43 %
Histopathology of Nodal and Extranodal Non-Hodgkin's Lymphomas
By: A. C. Feller, Alfred C. Feller, Jacques Diebold, M. Paulli, Alfred C Feller
Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
No Review Yet
₹17,117
₹9,757
Binding:
Hardback
Release:
20 Nov 2003
Language:
English
Available
Ships within 1-2 Days Explain..
7.
Characterization and Metrology for ULSI Technology 200533 %
Characterization and Metrology for ULSI Technology 2005
By: Stefan Zollner, Robert McDonald, David G Seiler, D G Seiler, Alain C Diebold
Publisher: Springer
No Review Yet
₹26,347
₹17,652
Binding:
Hardback
Release:
01 Sep 2005
Language:
English
Out of Stock
Notify me when this book is in stockNotify Me
8.
Characterization and Metrology for ULSI Technology38 %
Characterization and Metrology for ULSI Technology
By: Robert McDonald, W Murray Bullis, E Jane Walters, David G Seiler, Alain C Diebold
Publisher: American Institute of Physics
No Review Yet
₹13,650
₹8,463
Binding:
SF
Release:
14 Dec 1998
Language:
English
Out of Stock
Notify me when this book is in stockNotify Me
9.
Pigments, Extenders, and Particles in Surface Coatings and PlasticsNR
Pigments, Extenders, and Particles in Surface Coatings and Plastics
By: Backer Steven De Backer, Niedenzu Philipp M. Niedenzu, Diebold Michael Diebold
Publisher: Springer Nature B.V.
No Review Yet
₹4,297
Binding:
Paperback
Release:
06 Nov 2022
Language:
English
Out of Stock
Notify me when this book is in stockNotify Me
10.
Die Erblichen Myoklonisch-Epileptisch-Dementiellen Kernsyndrome: Progressive Myoklonusepilepsien - Dyssynergia Cerebellaris Myoclonica - Myoklonische Varianten Der Drei Nachinfantilen Formen Der Amaurotischen IdiotieNR
Die Erblichen Myoklonisch-Epileptisch-Dementiellen Kernsyndrome: Progressive Myoklonusepilepsien - Dyssynergia Cerebellaris Myoclonica - Myoklonische Varianten Der Drei Nachinfantilen Formen Der Amaurotischen Idiotie
By: K Diebold
Publisher: Springer
No Review Yet
₹5,330
Binding:
Hardback
Release:
08 Nov 2018
Language:
English
Out of Stock
Notify me when this book is in stockNotify Me
11.
Frontiers of Characterization and Metrology for NanoelectronicsNR
Frontiers of Characterization and Metrology for Nanoelectronics
By: Robert McDonald, David G Seiler, Alain C Diebold, C Michael Garner, Dan Herr
Publisher: American Institute of Physics
No Review Yet
₹15,975
Binding:
SF
Release:
01 Sep 2007
Language:
English
Out of Stock
Notify me when this book is in stockNotify Me
12.
Characterization and Metrology for ULSI TechnologyNR
Characterization and Metrology for ULSI Technology
By: Stefan Zollner, Robert McDonald, David G Seiler, Alain C Diebold, Eric M Secula
Publisher: American Institute of Physics
No Review Yet
₹18,805
Binding:
SF
Release:
08 Oct 2003
Language:
English
Out of Stock
Notify me when this book is in stockNotify Me
13.
Frontiers of Characterization and Metrology for Nanoelectronics: 2011NR
Frontiers of Characterization and Metrology for Nanoelectronics: 2011
By: Amal Chabli, Robert McDonald, David G Seiler, Alain C Diebold, Erik M Secula
Publisher: American Institute of Physics
No Review Yet
₹16,603
Binding:
Book
Release:
26 Apr 2012
Language:
English
Out of Stock
Notify me when this book is in stockNotify Me
No more records found