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Joseph (Ariel University, Ariel, Israel.) Bernstein

Joseph (Ariel University, Ariel, Israel.) Bernstein

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Reliability Prediction from Burn-In Data Fit to Reliability Models21 % POD/NR
Reliability Prediction from Burn-In Data Fit to Reliability Models
By: Joseph Bernstein, Joseph (Ariel University, Ariel, Israel.) Bernstein
Publisher: Academic Press
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₹5,216
₹4,121
Binding:
Paperback
Release:
21 Mar 2014
Language:
English
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