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Jordi Sune

Jordi Sune

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Reliability Wearout Mechanisms in Advanced CMOS Technologies
Reliability Wearout Mechanisms in Advanced CMOS Technologies
By: Timothy D. Sullivan, Alvin W. Strong, Ernest Y. Wu, Rolf-Peter Vollertsen, Jordi Sune
Publisher: Wiley-IEEE Press
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₹9,620
Binding:
Hardback
Release:
01 Sep 2009
Language:
English
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