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John A. Allgair

John A. Allgair

4 results found
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1.
Metrology, Inspection, and Process Control for Microlithography XXIINR
Metrology, Inspection, and Process Control for Microlithography XXII
By: John A. Allgair, Christopher J. Raymond
Publisher: Spie Press
No Review Yet
₹11,455
Binding:
Paperback
Release:
28 Apr 2008
Out of Stock
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2.
Metrology, Inspection, and Process Control for Microlithography XXIII3 % NR
Metrology, Inspection, and Process Control for Microlithography XXIII
By: John A. Allgair, Christopher J. Raymond
Publisher: Spie Press
No Review Yet
₹24,157
₹23,432
Binding:
Paperback
Release:
15 Mar 2009
Out of Stock
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3.
Instrumentation, Metrology, and Standards for Nanomanufacturing IINR
Instrumentation, Metrology, and Standards for Nanomanufacturing II
By: Michael T. Postek, John A. Allgair
Publisher: Spie Press
No Review Yet
₹10,708
Binding:
Paperback
Release:
28 Aug 2008
Out of Stock
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4.
Instrumentation, Metrology, and Standards for NanomanufacturingNR
Instrumentation, Metrology, and Standards for Nanomanufacturing
By: Michael T. Postek, John A. Allgair
Publisher: Spie Press
No Review Yet
₹10,708
Binding:
Paperback
Release:
10 Sep 2007
Out of Stock
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