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J. Patrick (University of Virginia, USA) Meyer

J. Patrick (University of Virginia, USA) Meyer

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1.
Applied Measurement with jMetrik47 %
Applied Measurement with jMetrik
By: J Patrick Meyer, J. Patrick (University of Virginia, USA) Meyer
Publisher: Routledge
No Review Yet
₹16,650
₹8,825
Binding:
Hardback
Release:
30 Jun 2014
Language:
English
Available
Ships within 12-14 Days Explain..
2.
Applied Measurement with jMetrik2 % NR
Applied Measurement with jMetrik
By: J Patrick Meyer, J. Patrick (University of Virginia, USA) Meyer
Publisher: Routledge
No Review Yet
₹5,376
₹5,268
Binding:
Paperback
Release:
30 Jun 2014
Language:
English
International Edition
Ships within 18-20 Days Explain..
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