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Haruhiko Ohashi (Editor)

Haruhiko Ohashi (Editor)

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Advances in Metrology for X-Ray and EUV Optics VINR
Advances in Metrology for X-Ray and EUV Optics VI
By: Lahsen Assoufid, Lahsen Assoufid (Editor), Haruhiko Ohashi (Editor), Anand Krishna Asundi (Editor), Haruhiko Ohashi
Publisher: Spie Press
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₹6,127
Binding:
Paperback
Release:
28 Feb 2017
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