Fabio PellizzerFabio Pellizzer received his M.S. degree in Electronic Engineering in 1996 from the University of Padova, Italy, with a thesis on characterization and reliability of thin gate oxides. In 1998 he joined the Central R&D department of STMicroelectronicsin Agrate Brianza (Italy) and worked on the development of several generations of NOR Flash memories, with a focus on gate oxides reliability. Since 2002 he has been in charge of the process development for phase change memories based on chalcogenide materials. Since March 2008 he joined Numonyx as Phase-Change Memory manager in the R&D Technology Development. In May 2011, he joined Micron Technology, where he is responsible for the development of new memory technologies. He is now a Distinguished Member of Technical Staff and Cell Development manager for 3DXPoint technology in Boise (USA). He has authored more than 60 publications on international journals and books and several invited talks at international conferences. He holds more than 130 granted US and European patents on phase-change memories and chalcogenide materials (related to process integration, algorithms and design solutions). Read More Read Less