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Eran Gur

Eran Gur

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1.
New Approaches to Image Processing Based Failure Analysis of Nano-Scale ULSI Devices18 % NR
New Approaches to Image Processing Based Failure Analysis of Nano-Scale ULSI Devices
By: Pavel Livshits, Zeev Zalevsky, Eran Gur, Eran (Dept. of Electronics Engineering, Jerusalem College of Engineering, Jerusalem, 91035, Israel) Gur, Pavel (Researcher at Bar-Ilan University, Faculty of Engineering, Israel) Livshits
Publisher: William Andrew
No Review Yet
₹4,196
₹3,441
Binding:
Paperback
Release:
18 Nov 2013
Language:
English
International Edition
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2.
Modular Optical Systems for Data Processing and Manipulation5 % POD/NR
Modular Optical Systems for Data Processing and Manipulation
By: Eran Gur
Publisher: VDM Verlag
No Review Yet
₹6,169
₹5,861
Binding:
Paperback
Release:
17 Apr 2009
Language:
English
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Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
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