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Eran (Dept. of Electronics Engineering, Jerusalem College of Engineering, Jerusalem, 91035, Israel) Gur

Eran (Dept. of Electronics Engineering, Jerusalem College of Engineering, Jerusalem, 91035, Israel) Gur

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New Approaches to Image Processing Based Failure Analysis of Nano-Scale ULSI Devices24 % NR
New Approaches to Image Processing Based Failure Analysis of Nano-Scale ULSI Devices
By: Pavel Livshits, Zeev Zalevsky, Eran Gur, Eran (Dept. of Electronics Engineering, Jerusalem College of Engineering, Jerusalem, 91035, Israel) Gur, Pavel (Researcher at Bar-Ilan University, Faculty of Engineering, Israel) Livshits
Publisher: William Andrew
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₹4,346
₹3,303
Binding:
Paperback
Release:
18 Nov 2013
Language:
English
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