Eishi Ibe

Eishi Ibe

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1.
Terrestrial Neutron-Induced Soft Errors in Advanced Memory Devices48 %
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2.
Dependability in Electronic Systems43 %
Publisher: Springer
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₹9,510
₹5,421
Binding:
Hardback
Release:
24 Nov 2010
Language:
English
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3.
Dependability in Electronic Systems37 %
Publisher: Springer
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₹10,766
₹6,783
Binding:
Paperback
Release:
09 Oct 2014
Language:
English
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