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Eiji (Hitachi Ltd.) Takeda

Eiji (Hitachi Ltd.) Takeda

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Hot-Carrier Effects in Mos Devices

Hot-Carrier Effects in Mos Devices

By: Eiji Takeda, Akemi Miura-Hamada, Eiji (Hitachi Ltd.) Takeda, Cary Y. (Santa Clara University) Yang, Akemi (Hitachi Ltd.) Miura-Hamada

Publisher: Academic Press

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₹3,057

Binding:	Hardback
Release:	20 Nov 1995
Language:	English

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