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Diebold Alain Diebold

Diebold Alain Diebold

11 results found
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1.
Optical and Electrical Properties of Nanoscale Materials37 %
Optical and Electrical Properties of Nanoscale Materials
By: Alain Diebold, Tino Hofmann
Publisher: Springer International Publishing
No Review Yet
₹15,360
₹9,677
Binding:
Paperback
Release:
12 Jan 2023
Language:
English
Available
Ships within 12-14 Days Explain..
2.
Optical and Electrical Properties of Nanoscale Materials37 %
Optical and Electrical Properties of Nanoscale Materials
By: Alain Diebold, Tino Hofmann
Publisher: Springer International Publishing
No Review Yet
₹15,360
₹9,677
Binding:
Hardback
Release:
05 Sep 2021
Language:
English
Available
Ships within 12-14 Days Explain..
3.
Frontiers of Characterization and Metrology for Nanoelectronics
Frontiers of Characterization and Metrology for Nanoelectronics
By: Robert McDonald, David G Seiler, Alain C Diebold, C Michael Garner, Dan Herr
Publisher: American Institute of Physics
No Review Yet
₹5,474
Binding:
SF
Release:
26 Oct 2009
Language:
English
Available
Ships within 4-6 Days Explain..
4.
Handbook of Silicon Semiconductor Metrology1 % POD/NR
Handbook of Silicon Semiconductor Metrology
By: Alain C. Diebold, Alain C. (Sematech, Austin, Texas, USA) Diebold, Alain C Diebold
Publisher: Taylor and Francis
No Review Yet
₹7,055
₹6,984
Binding:
Paperback
Release:
17 Oct 2019
Language:
English
International Edition
Ships within 18-20 Days Explain..
Free Shipping in India and low cost Worldwide.
Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
5.
Handbook of Silicon Semiconductor Metrology7 % POD/NR
Handbook of Silicon Semiconductor Metrology
By: Alain C. Diebold, Diebold C. Diebold, Alain C. (Sematech, Austin, Texas, USA) Diebold, Alain C Diebold
Publisher: Taylor & Francis Inc
No Review Yet
₹36,563
₹34,004
Binding:
Hardback
Release:
29 Jun 2001
Language:
English
International Edition
Ships within 18-20 Days Explain..
Free Shipping in India and low cost Worldwide.
Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
6.
Characterization and Metrology for ULSI Technology 200533 %
Characterization and Metrology for ULSI Technology 2005
By: Stefan Zollner, Robert McDonald, David G Seiler, D G Seiler, Alain C Diebold
Publisher: Springer
No Review Yet
₹26,347
₹17,652
Binding:
Hardback
Release:
01 Sep 2005
Language:
English
Out of Stock
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7.
Characterization and Metrology for ULSI Technology38 %
Characterization and Metrology for ULSI Technology
By: Robert McDonald, W Murray Bullis, E Jane Walters, David G Seiler, Alain C Diebold
Publisher: American Institute of Physics
No Review Yet
₹13,650
₹8,463
Binding:
SF
Release:
14 Dec 1998
Language:
English
Out of Stock
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8.
Optical and Electrical Properties of Nanoscale Materials1 % NR
Optical and Electrical Properties of Nanoscale Materials
By: Hofmann Tino Hofmann, Diebold Alain Diebold
Publisher: Springer Nature B.V.
No Review Yet
₹4,239
₹4,197
Binding:
Paperback
Release:
12 Jan 2022
Language:
English
Out of Stock
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9.
Characterization and Metrology for ULSI TechnologyNR
Characterization and Metrology for ULSI Technology
By: Stefan Zollner, Robert McDonald, David G Seiler, Alain C Diebold, Eric M Secula
Publisher: American Institute of Physics
No Review Yet
₹18,805
Binding:
SF
Release:
08 Oct 2003
Language:
English
Out of Stock
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10.
Frontiers of Characterization and Metrology for Nanoelectronics: 2011NR
Frontiers of Characterization and Metrology for Nanoelectronics: 2011
By: Amal Chabli, Robert McDonald, David G Seiler, Alain C Diebold, Erik M Secula
Publisher: American Institute of Physics
No Review Yet
₹16,603
Binding:
Book
Release:
26 Apr 2012
Language:
English
Out of Stock
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11.
Frontiers of Characterization and Metrology for NanoelectronicsNR
Frontiers of Characterization and Metrology for Nanoelectronics
By: Robert McDonald, David G Seiler, Alain C Diebold, C Michael Garner, Dan Herr
Publisher: American Institute of Physics
No Review Yet
₹15,975
Binding:
SF
Release:
01 Sep 2007
Language:
English
Out of Stock
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